Inventor · disambiguated record
Tatsuhito Kimura
Also filed as: KIMURA TATSUHITO
11 granted patents·2 pending applications·58 citations·filing 1995–2025
86Inventor score
Top patents by PatentIndex Score
13 records- 0192US11837437B2Specimen machining device and information provision methodJEOL LTD·Filed 2022·Granted Dec 5, 2023·2 cites·9 claims
- 0288US7569083B2Gas diffusion electrode assembly, bonding method for gas diffusion electrodes, and electrolyzer comprising gas diffusion electrodesCHLORINE ENG CORP LTD·Filed 2008·Granted Aug 4, 2009·10 cites·13 claims
- 0381US7404878B2Gas diffusion electrode assembly, bonding method for gas diffusion electrodes, and electrolyzer comprising gas diffusion electrodesCHLORINE ENG CORP LTD·Filed 2004·Granted Jul 29, 2008·17 cites·2 claims
- 0473US12500059B2Sample milling apparatus, shield plate, and sample milling methodJEOL LTD·Filed 2023·Granted Dec 16, 2025·0 cites·13 claims
- 0566US12482629B2Specimen processing holder and specimen processing methodJEOL LTD·Filed 2023·Granted Nov 25, 2025·0 cites·12 claims
- 0661US11929238B2Ion beam processing apparatus and method for controlling operation thereofJEOL LTD·Filed 2022·Granted Mar 12, 2024·0 cites·7 claims
- 0761US2024331970A1Sample Holder and Sample Processing ApparatusJEOL LTD·Filed 2024·Application pending·0 cites
- 0860US2025299911A1JigJEOL LTD·Filed 2025·Application pending·0 cites
- 0957US5571390ABipolar ion exchange membrane electrolytic cellASAHI GLASS CO LTD·Filed 1995·Granted Nov 5, 1996·14 cites·5 claims
- 1054US12476071B2Specimen machining device and specimen machining methodJEOL LTD·Filed 2022·Granted Nov 18, 2025·0 cites·9 claims
- 1153US12429333B2Specimen machining device and specimen machining methodJEOL LTD·Filed 2022·Granted Sep 30, 2025·0 cites·15 claims
- 1251US6495006B1Bipolar ion exchange membrane electrolytic cellASAHI GLASS CO LTD·Filed 1999·Granted Dec 17, 2002·13 cites·18 claims
- 1327US6063257ABipolar type ion exchange membrane electrolytic cellASAHI GLASS CO LTD·Filed 1998·Granted May 16, 2000·2 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →