Inventor · disambiguated record
Tamotsu Kitamura
Also filed as: KITAMURA TAMOTSU
11 granted patents·2 pending applications·71 citations·filing 2001–2008
88Inventor score
Top patents by PatentIndex Score
13 records- 0175US6596549B2Automatic wiring method for semiconductor package enabling design of high-speed wiring for semiconductor package with reduced laborSHINKO ELECTRIC IND CO·Filed 2001·Granted Jul 22, 2003·29 cites·5 claims
- 0269US7543263B2Automatic trace shaping methodSHINKO ELECTRIC IND CO·Filed 2007·Granted Jun 2, 2009·5 cites·9 claims
- 0369US7496878B2Automatic wiring method and apparatus for semiconductor package and automatic identifying method and apparatus for semiconductor packageSHINKO ELECTRICS IND CO LTD·Filed 2005·Granted Feb 24, 2009·9 cites·44 claims
- 0468US7607113B2Wiring pattern determination method and computer program product thereofSHINKO ELECTRIC IND CO·Filed 2006·Granted Oct 20, 2009·4 cites·4 claims
- 0567US7454736B2Automatic trace determination apparatus and computer program thereofSHINKO ELECTRIC IND CO·Filed 2006·Granted Nov 18, 2008·4 cites·11 claims
- 0667US7191415B2Clearance inspection apparatus and clearance inspection methodSHINKO ELECTRIC IND CO·Filed 2005·Granted Mar 13, 2007·6 cites·10 claims
- 0763US7673269B2Automatic trace determination apparatus and methodSHINKO ELECTRIC IND CO·Filed 2006·Granted Mar 2, 2010·3 cites·20 claims
- 0859US6662351B2Wiring editing method, for semiconductor package, capable of easily editing offset of wiring patternSHINKO ELECTRIC IND CO·Filed 2001·Granted Dec 9, 2003·11 cites·2 claims
- 0947US2009158233A1Automatic design method and computer program thereofSHINKO ELECTRIC IND CO·Filed 2008·Application pending·0 cites
- 1046US2009007049A1Automatic trace design methodSHINKO ELECTRIC IND CO·Filed 2008·Application pending·0 cites
- 1145US7469397B2Automatic trace determination method and apparatus for automatically determining optimal trace positions on substrate using computationSHINKO ELECTRIC IND CO·Filed 2005·Granted Dec 23, 2008·0 cites·11 claims
- 1244US7627846B2Method and apparatus for automatically shaping traces on surface of substrate of semiconductor package by using computationSHINKO ELECTRIC IND CO·Filed 2007·Granted Dec 1, 2009·0 cites·11 claims
- 1344US7546569B2Automatic trace determination methodSHINKO ELECTRIC IND CO·Filed 2006·Granted Jun 9, 2009·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →