Inventor · disambiguated record
Tatsunori Komoike
Also filed as: KOMOIKE TATSUNORI
11 granted patents·1 pending application·207 citations·filing 1992–2002
91Inventor score
Top patents by PatentIndex Score
12 records- 0192US6345004B1Repair analysis circuit for redundancy, redundant repairing method, and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 5, 2002·86 cites·8 claims
- 0256US6094736ASemiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jul 25, 2000·17 cites·12 claims
- 0350US5315182ASemiconductor integrated circuit having annular power supply with plural linesMITSUBISHI ELECTRIC CORP·Filed 1992·Granted May 24, 1994·20 cites·11 claims
- 0449US6717235B2Semiconductor integrated circuit device having a test pathRENESAS TECH CORP·Filed 2002·Granted Apr 6, 2004·4 cites·8 claims
- 0549US5715171ALogical synthesizing device, logical synthesizing method, and semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Feb 3, 1998·24 cites·10 claims
- 0646US5889422ASemiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Mar 30, 1999·9 cites·7 claims
- 0745US6367044B1Semiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Apr 2, 2002·10 cites·4 claims
- 0844US5633806ASemiconductor integrated circuit and method of designing sameMITSUBISHI ELECTRIC CORP·Filed 1995·Granted May 27, 1997·18 cites·31 claims
- 0942US5493506AIntegrated circuit device and method of designing sameMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Feb 20, 1996·14 cites·34 claims
- 1033US6553528B1Test circuit for semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Apr 22, 2003·4 cites·12 claims
- 1133US2002199145A1Semiconductor integrated circuits built therein scan pathsFiled 2002·Application pending·0 cites
- 1230US6137330AIntegrated circuit including functional blocks controlled by common synchronizing control transistorsMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 24, 2000·1 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →