Inventor · disambiguated record
Takuya Kouno
Also filed as: KOUNO TAKUYA
6 granted patents·89 citations·filing 1999–2007
83Inventor score
Files withTOSHIBA KK6
Top patents by PatentIndex Score
6 records- 0191US7546178B2Aligner evaluation system, aligner evaluation method, a computer program product, and a method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2007·Granted Jun 9, 2009·14 cites·18 claims
- 0287US6437858B1Aberration measuring method, aberration measuring system and aberration measuring maskTOSHIBA KK·Filed 2000·Granted Aug 20, 2002·33 cites·12 claims
- 0368US6558852B1Exposure method, reticle, and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2000·Granted May 6, 2003·12 cites·20 claims
- 0465US6163376AAlignment apparatus, aberration measuring method and aberration measuring markTOSHIBA KK·Filed 1999·Granted Dec 19, 2000·24 cites·16 claims
- 0557US7269470B2Aligner evaluation system, aligner evaluation method, a computer program product, and a method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2003·Granted Sep 11, 2007·4 cites·18 claims
- 0649US7100146B2Design system of alignment marks for semiconductor manufactureTOSHIBA KK·Filed 2003·Granted Aug 29, 2006·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →