Inventor · disambiguated record
Takaaki Kumazawa
Also filed as: KUMAZAWA TAKAAKI
9 granted patents·3 pending applications·125 citations·filing 1999–2017
87Inventor score
Files withHITACHI LTD7KUMAZAWA TAKAAKI1MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1NINAGAWA NORIYASU1PANASONIC IP MAN CO LTD1
Top patents by PatentIndex Score
12 records- 0196US6771077B2Method of testing electronic devices indicating short-circuitHITACHI LTD·Filed 2002·Granted Aug 3, 2004·85 cites·11 claims
- 0272US6895346B2Method for test conditionsHITACHI LTD·Filed 2002·Granted May 17, 2005·10 cites·15 claims
- 0370US7899567B2Method and program for selecting product to be inspectedHITACHI LTD·Filed 2008·Granted Mar 1, 2011·3 cites·4 claims
- 0468US6780660B2System for testing electronic devicesHITACHI LTD·Filed 2002·Granted Aug 24, 2004·9 cites·10 claims
- 0567US6770496B2Method of testing electronic devicesHITACHI LTD·Filed 2002·Granted Aug 3, 2004·8 cites·12 claims
- 0654US2005071259A1System and apparatus for managing information on chemical substances used in productFiled 2004·Application pending·0 cites
- 0749US7840361B2Method for calculating environmental load, program for calculating environmental load, and method for converting unitsHITACHI LTD·Filed 2007·Granted Nov 23, 2010·0 cites·2 claims
- 0848US2006053070A1Parts table management system, parts table preparation method and programKUMAZAWA TAKAAKI·Filed 2005·Application pending·0 cites
- 0947US6704495B1Audio-video device reproducing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Mar 9, 2004·10 cites·21 claims
- 1046US2007061310A1Method for extracting injustice of component attribute information and system for extracting injustice of object attribute informationNINAGAWA NORIYASU·Filed 2006·Application pending·0 cites
- 1138US6841405B2Photomask for test wafersHITACHI LTD·Filed 2002·Granted Jan 11, 2005·0 cites·16 claims
- 1234US10789974B2Tonearm unit and playback devicePANASONIC IP MAN CO LTD·Filed 2017·Granted Sep 29, 2020·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →