Inventor · disambiguated record
Tatsuya Kunikiyo
Also filed as: KUNIKIYO TATSUYA
63 granted patents·10 pending applications·2,403 citations·filing 1989–2018
99Inventor score
Files withMITSUBISHI ELECTRIC CORP43RENESAS TECH CORP14RENESAS ELECTRONICS CORP12MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2KUNIKIYO TATSUYA1
Top patents by PatentIndex Score
73 records- 0199US6341087B1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 22, 2002·329 cites·17 claims
- 0297US6717267B1Semiconductor device having multilayer interconnection structureRENESAS TECH CORP·Filed 2000·Granted Apr 6, 2004·140 cites·11 claims
- 0397US6333232B1Semiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 25, 2001·138 cites·10 claims
- 0496US6661065B2Semiconductor device and SOI substrateMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 9, 2003·126 cites·17 claims
- 0596US6222217B1Semiconductor device and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Apr 24, 2001·159 cites·3 claims
- 0695US9048158B2Semiconductor device with isolation insulating layer containing air gapRENESAS ELECTRONICS CORP·Filed 2014·Granted Jun 2, 2015·10 cites·7 claims
- 0794US6950369B2Magnetic memory device capable of passing bidirectional currents through the bit linesMITSUBISHI ELECTRIC CORP·Filed 2004·Granted Sep 27, 2005·71 cites·4 claims
- 0894US6567299B2Magnetic memory device and magnetic substrateMITSUBISHI ELECTRIC CORP·Filed 2001·Granted May 20, 2003·83 cites·4 claims
- 0993US6314021B1Nonvolatile semiconductor memory device and semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Nov 6, 2001·62 cites·15 claims
- 1092US8956941B2Manufacturing method of semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2014·Granted Feb 17, 2015·11 cites·13 claims
- 1192US6429487B1Semiconductor device having gate to body connectionMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Aug 6, 2002·68 cites·18 claims
- 1289US6762477B2Semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Jul 13, 2004·56 cites·5 claims
- 1389US6741495B2Magnetic memory device and magnetic substrateMITSUBISHI ELECTRIC CORP·Filed 2003·Granted May 25, 2004·41 cites·2 claims
- 1489US6495424B2Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 17, 2002·46 cites·4 claims
- 1589US6380578B1High-speed stacked capacitor in SOI structureMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Apr 30, 2002·39 cites·7 claims
- 1688US8884319B2Semiconductor device with isolation insulating layer containing air gapKUNIKIYO TATSUYA·Filed 2012·Granted Nov 11, 2014·8 cites·8 claims
- 1788US6639288B1Semiconductor device with a particular conductor arrangementMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 28, 2003·36 cites·20 claims
- 1888US6465335B1Method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 15, 2002·46 cites·7 claims
- 1987US6429105B1Method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Aug 6, 2002·48 cites·13 claims
- 2086US6303483B1Method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 16, 2001·38 cites·9 claims
- 2186US6285079B1Semiconductor device employing grid array electrodes and compact chip-size packageMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Sep 4, 2001·83 cites·9 claims
- 2285US9184264B2Manufacturing method of semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2014·Granted Nov 10, 2015·5 cites·13 claims
- 2385US6956289B2Semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Oct 18, 2005·32 cites·5 claims
- 2485US6096641AMethod of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Aug 1, 2000·60 cites·13 claims
- 2585US5514880AField effect thin-film transistor for an SRAM with reduced standby currentMITSUBISHI ELECTRIC CORP·Filed 1993·Granted May 7, 1996·56 cites·15 claims
- 2684US6914806B2Magnetic memory deviceRENESAS TECH CORP·Filed 2002·Granted Jul 5, 2005·34 cites·18 claims
- 2784US6538954B2Multi-port static random access memory equipped with a write control lineMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Mar 25, 2003·36 cites·20 claims
- 2883US6545318B1Semiconductor device and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Apr 8, 2003·31 cites·8 claims
- 2982US6608345B2Nonvolatile semiconductor memory device and semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Aug 19, 2003·26 cites·2 claims
- 3081US7230435B2Capacitance measurement circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jun 12, 2007·25 cites·8 claims
- 3181US6620703B2Method of forming an integrated circuit using an isolation trench having a cavity formed by reflowing a doped glass mask layerMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Sep 16, 2003·23 cites·2 claims
- 3281US5736438AField effect thin-film transistor and method of manufacturing the same as well as semiconductor device provided with the sameMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Apr 7, 1998·46 cites·4 claims
- 3380US6396113B1Active trench isolation structure to prevent punch-through and junction leakageMITSUBISHI ELECTRIC CORP·Filed 2000·Granted May 28, 2002·28 cites·15 claims
- 3479US6737944B2Active inductorRENESAS TECH CORP·Filed 2001·Granted May 18, 2004·20 cites·6 claims
- 3579US5854509AMethod of fabricating semiconductor device and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 29, 1998·57 cites·19 claims
- 3676US6754098B2Semiconductor memory deviceRENESAS TECH CORP·Filed 2002·Granted Jun 22, 2004·17 cites·9 claims
- 3776US5070469ATopography simulation methodMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Dec 3, 1991·48 cites·2 claims
- 3874US6429505B1SOI semiconductor controlled rectifier and diode for electrostatic discharge protectionMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Aug 6, 2002·18 cites·13 claims
- 3972US5067101ATopography simulation methodMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Nov 19, 1991·40 cites·2 claims
- 4071US6316799B1Memory cell, method of controlling same and method of manufacturing sameMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Nov 13, 2001·23 cites·5 claims
- 4168US6876208B2Semiconductor device and method of checking semiconductor storage deviceRENESAS TECH CORP·Filed 2002·Granted Apr 5, 2005·13 cites·12 claims
- 4268US6500720B2Method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 31, 2002·11 cites·17 claims
- 4366US10566373B2Solid state image sensor and manufacturing method thereofRENESAS ELECTRONICS CORP·Filed 2018·Granted Feb 18, 2020·1 cites·15 claims
- 4458US6982555B2Semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jan 3, 2006·8 cites·12 claims
- 4558US6809336B2Semiconductor device comprising sense amplifier and manufacturing method thereofRENESAS TECH CORP·Filed 2002·Granted Oct 26, 2004·10 cites·16 claims
- 4656US9894293B2Semiconductor device, method of manufacturing same, and method of controlling semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Feb 13, 2018·0 cites·9 claims
- 4756US6894520B2Semiconductor device and capacitance measurement methodRENESAS TECH CORP·Filed 2003·Granted May 17, 2005·8 cites·11 claims
- 4856US2002111821A1Information provider device, information provider system and advertising methodMITSUBISHI ELECTRIC CORP·Filed 2001·Application pending·0 cites
- 4956US2002128880A1Information management device and information management systemMITSUBISHI ELECTRIC CORP·Filed 2001·Application pending·0 cites
- 5055US6737314B2Semiconductor device manufacturing method and semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted May 18, 2004·6 cites·3 claims
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →