Inventor · disambiguated record
Tateo Kusama
Also filed as: KUSAMA TATEO
4 granted patents·95 citations·filing 1990–1993
79Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0168US5047713AMethod and apparatus for measuring a deep impurity level of a semiconductor crystalSEMITEX CO LTD·Filed 1990·Granted Sep 10, 1991·35 cites·10 claims
- 0262US5081414AMethod for measuring lifetime of semiconductor material and apparatus thereforSEMITEX CO LTD·Filed 1990·Granted Jan 14, 1992·26 cites·17 claims
- 0348US5138255AMethod and apparatus for measuring lifetime of semiconductor material including waveguide tuning meansSEMITEX CO LTD·Filed 1991·Granted Aug 11, 1992·18 cites·6 claims
- 0442US5451886AMethod of evaluating lifetime of semiconductor material and apparatus for the sameSCHOOL JUDICIAL PERSON IKUTOKU·Filed 1993·Granted Sep 19, 1995·16 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →