Inventor · disambiguated record

Tai Chui Lam

Also filed as: LAM TAY CHUI

1 granted patent·5 citations·filing 2002–2002

26Inventor score

Technology areasG01N

Files withCHARTERED SEMICONDUCTOR MFG1

Top patents by PatentIndex Score

1 record

0153US6683304B1Method for a plan-view transmission electron microscopy sample preparation technique for via and contact characterizationCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Jan 27, 2004·5 cites·21 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →