Inventor · disambiguated record

Takashi Mikuchi

Also filed as: MIKUCHI TAKASHI

1 granted patent·1 pending application·14 citations·filing 2003–2003

36Inventor score

Technology areasG03F

Files withNIKON CORP2

Top patents by PatentIndex Score

2 records

0168US6706456B2Method of determining exposure conditions, exposure method, device manufacturing method, and storage mediumNIKON CORP·Filed 2003·Granted Mar 16, 2004·14 cites·52 claims
0230US2004179190A1Optical properties measurement method, exposure method, and device manufacturing methodNIKON CORP·Filed 2003·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →