Inventor · disambiguated record
Takafumi Miwa
Also filed as: MIWA TAKAFUMI
18 granted patents·3 pending applications·60 citations·filing 2012–2025
91Inventor score
Top patents by PatentIndex Score
21 records- 0198US11043359B2Charged particle beam apparatus and charged particle beam inspection systemHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 22, 2021·14 cites·10 claims
- 0296US11398367B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 26, 2022·4 cites·11 claims
- 0392US10872742B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 22, 2020·8 cites·15 claims
- 0491US11011348B2Scanning electron microscope and sample observation method using scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted May 18, 2021·8 cites·12 claims
- 0590US11398366B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 26, 2022·2 cites·14 claims
- 0688US11749494B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Sep 5, 2023·1 cites·16 claims
- 0788US9236220B2Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 12, 2016·8 cites·17 claims
- 0882US8907279B2Electron microscope and image capturing method using electron beamTSUNO NATSUKI·Filed 2012·Granted Dec 9, 2014·8 cites·19 claims
- 0976US9543053B2Electron beam equipmentHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 10, 2017·3 cites·11 claims
- 1075US10134558B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 20, 2018·2 cites·8 claims
- 1174US11735394B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Aug 22, 2023·1 cites·11 claims
- 1273US12106930B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 1, 2024·1 cites·15 claims
- 1371US11646172B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted May 9, 2023·0 cites·14 claims
- 1460US2025239430A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2025·Application pending·0 cites
- 1558US2024346818A1Inspection deviceHITACHI LTD·Filed 2022·Application pending·0 cites
- 1655US11143606B2Particle measuring device and particle measuring methodHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 12, 2021·0 cites·15 claims
- 1754US11335535B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted May 17, 2022·0 cites·3 claims
- 1852US2025232944A1Multipole lens and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1948US9202668B2Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimenHITACHI HIGH TECH CORP·Filed 2012·Granted Dec 1, 2015·0 cites·17 claims
- 2044US11380518B2Measurement system and method for setting observation conditions of measurement apparatusHITACHI LTD·Filed 2019·Granted Jul 5, 2022·0 cites·14 claims
- 2140US9799486B2Charged particle beam apparatus for measuring surface potential of a sampleHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 24, 2017·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →