Inventor · disambiguated record
Tatsuya Miyatani
Also filed as: MIYATANI TATSUYA
16 granted patents·5 pending applications·152 citations·filing 1998–2014
92Inventor score
Files withSEIKO INSTR INC9SAKURA FINETEK JAPAN CO LTD4MIYATANI TATSUYA3FUJIMOTO KOJI2FUJIWARA HIROHITO1
Top patents by PatentIndex Score
21 records- 0192US8074547B2Automatic slicing apparatusITO TETSUMASA·Filed 2007·Granted Dec 13, 2011·33 cites·6 claims
- 0290US7866464B2Thin-section conveyor apparatus, thin-section scooping tool, and method for transporting thin sectionsSEIKO INSTR INC·Filed 2007·Granted Jan 11, 2011·16 cites·6 claims
- 0386US7966091B2Automatic thin-section slides manufacturing system and methodSEIKO INSTR INC·Filed 2007·Granted Jun 21, 2011·11 cites·20 claims
- 0481US7802507B2Automatic sliced piece fabricating apparatus and automatic sliced piece sample fabricating apparatusSEIKO INSTR INC·Filed 2007·Granted Sep 28, 2010·7 cites·11 claims
- 0575US8245613B2Thin-section manufacturing apparatusMIYATANI TATSUYA·Filed 2009·Granted Aug 21, 2012·9 cites·6 claims
- 0672US10488303B2Replacement blade supplying mechanismSAKURA FINETEK JAPAN CO LTD·Filed 2013·Granted Nov 26, 2019·2 cites·3 claims
- 0766US8087334B2Sectioning instrumentMIYATANI TATSUYA·Filed 2006·Granted Jan 3, 2012·5 cites·12 claims
- 0865US6094972ASampling scanning probe microscope and sampling method thereofSEIKO INSTR INC·Filed 1998·Granted Aug 1, 2000·32 cites·21 claims
- 0964US7616302B2Container for processing section samples, processing method for section samples, and processing apparatus for section samplesSEIKO INSTR INC·Filed 2006·Granted Nov 10, 2009·1 cites·3 claims
- 1062US6215121B1Three-dimensional scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Apr 10, 2001·28 cites·17 claims
- 1161US8156853B2Automatic thin-section manufacturing systemFUJIWARA HIROHITO·Filed 2008·Granted Apr 17, 2012·2 cites·5 claims
- 1250US6740876B2Scanning probe microscopeSEIKO INSTR INC·Filed 2001·Granted May 25, 2004·2 cites·27 claims
- 1349US9291532B2Automatic thin section sample preparation deviceSAKURA FINETEK JAPAN CO LTD·Filed 2013·Granted Mar 22, 2016·0 cites·6 claims
- 1447US2008044315A1Embedding cassetteFUJIMOTO KOJI·Filed 2007·Application pending·0 cites
- 1546US9983100B2Thin section preparation deviceSAKURA FINETEK JAPAN CO LTD·Filed 2013·Granted May 29, 2018·0 cites·3 claims
- 1644US10018535B2Thin-slice manufacturing device and thin-slice manufacturing methodSAKURA FINETEK JAPAN CO LTD·Filed 2014·Granted Jul 10, 2018·0 cites·12 claims
- 1744US2007204740A1Automatic instrument for fabricating prepared slide of tissue section and automatic prepared slide fabricating methodMIYATANI TATSUYA·Filed 2006·Application pending·0 cites
- 1842US2008044649A1Identification code labeling tapeSEIKO INSTR INC·Filed 2007·Application pending·0 cites
- 1941US6710339B2Scanning probe microscopeSEIKO INSTR INC·Filed 2001·Granted Mar 23, 2004·4 cites·18 claims
- 2041US2010229702A1Automatic Prepared Slide Fabricating Apparatus and Automatic Prepared Slide Fabricating MethodFUJIMOTO KOJI·Filed 2007·Application pending·0 cites
- 2134US2010279342A1Thin-section slides manufacturing apparatus and method for manufactring thin-section slidesKIJIMA YUKIMITSU·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →