Inventor · disambiguated record
Takafumi Morimoto
Also filed as: MORIMOTO TAKAFUMI
15 granted patents·7 pending applications·512 citations·filing 1995–2021
94Inventor score
Files withHITACHI CONSTRUCTION MACHINERY6HITACHI LTD5HITACHI KENKI FINE TECH CO LTD3BABA SHUICHI1HIDAKA KISHIO1
Top patents by PatentIndex Score
22 records- 0186US8011230B2Scanning probe microscopeHITACHI LTD·Filed 2008·Granted Sep 6, 2011·10 cites·11 claims
- 0285US7631548B2Scanning probe microscopeHITACHI LTD·Filed 2007·Granted Dec 15, 2009·10 cites·20 claims
- 0379US6229607B1Fine movement mechanism unit and scanning probe microscopeHITACHI CONSTRUCTION MACHINERY·Filed 1998·Granted May 8, 2001·87 cites·5 claims
- 0478US5870716AHome terminal and shopping systemHITACHI LTD·Filed 1995·Granted Feb 9, 1999·272 cites·11 claims
- 0576US6881954B1Scanning probe microscope and method of measurementHITACHI CONSTRUCTION MACHINERY·Filed 2000·Granted Apr 19, 2005·36 cites·22 claims
- 0675US8844061B2Scanning probe microscopeBABA SHUICHI·Filed 2012·Granted Sep 23, 2014·3 cites·9 claims
- 0773US8342008B2Scanning probe microscopeHITACHI LTD·Filed 2008·Granted Jan 1, 2013·3 cites·7 claims
- 0866US5965881AScanning probe microscope and processing apparatusHITACHI CONSTRUCTION MACHINERY·Filed 1997·Granted Oct 12, 1999·32 cites·27 claims
- 0959US6278113B1Scanning probe microscopeHITACHI CONSTRUCTION MACHINERY·Filed 1998·Granted Aug 21, 2001·27 cites·5 claims
- 1057US7333191B2Scanning probe microscope and measurement method using the sameHITACHI KENKI FINETECH CO LTD·Filed 2004·Granted Feb 19, 2008·11 cites·10 claims
- 1155US7243441B2Method and apparatus for measuring depth of holes formed on a specimenHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jul 17, 2007·8 cites·4 claims
- 1254US2014298548A1Scanning probe microscopeHITACHI LTD·Filed 2014·Application pending·0 cites
- 1346US7388199B2Probe manufacturing method, probe, and scanning probe microscopeHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jun 17, 2008·5 cites·17 claims
- 1444US2008087820A1Probe control method for scanning probe microscopeKURENUMA TORU·Filed 2007·Application pending·0 cites
- 1543US7350404B2Scanning type probe microscope and probe moving control method thereforHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Apr 1, 2008·3 cites·4 claims
- 1642US12181867B2Work machineHITACHI CONSTRUCTION MACH CO·Filed 2021·Granted Dec 31, 2024·0 cites·5 claims
- 1741US2007051887A1Cantilever and inspecting apparatusHIDAKA KISHIO·Filed 2006·Application pending·0 cites
- 1841US2010043108A1Probe for scanning probe microscopeHITACHI CONSTRUCTION MACHINERY·Filed 2008·Application pending·0 cites
- 1940US2008245139A1Scanning probe microscope and measurement method of sameMORIMOTO TAKAFUMI·Filed 2008·Application pending·0 cites
- 2036US6184533B1Scanning probe microscope with the stage unitHITACHI CONSTRUCTION MACHINERY·Filed 1998·Granted Feb 6, 2001·5 cites·16 claims
- 2134US2008236259A1Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe MicroscopeKURENUMA TOORU·Filed 2005·Application pending·0 cites
- 2233US2007180889A1Probe replacement method for scanning probe microscopeMURAYAMA KEN·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →