Inventor · disambiguated record
Takashi Motoyama
Also filed as: MOTOYAMA TAKASHI
4 granted patents·1 pending application·5 citations·filing 2009–2024
62Inventor score
Top patents by PatentIndex Score
5 records- 0162US9869715B2Semiconductor wafer inspection apparatus and semiconductor wafer inspection methodTOKYO SEIMITSU CO LTD·Filed 2016·Granted Jan 16, 2018·1 cites·10 claims
- 0252US2024274492A1Temperature adjustment deviceKELK LTD·Filed 2024·Application pending·0 cites
- 0349US8547279B2Incoming wave classifying and distinguishing device, incoming wave classifying and distinguishing method, originating position estimating device and originating position estimating methodTOKUHIRO TAKAFUMI·Filed 2009·Granted Oct 1, 2013·3 cites·12 claims
- 0448US12444626B2Temperature control device for semiconductor wafer and temperature control method for semiconductor waferKELK LTD·Filed 2022·Granted Oct 14, 2025·0 cites·6 claims
- 0545US8693285B2Sound generation system, ultrasonic wave emitting device, and ultrasonic wave emitting methodWATANABE AYASE·Filed 2011·Granted Apr 8, 2014·1 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →