Inventor · disambiguated record
Takanori Murano
Also filed as: MURANO TAKANORI
9 granted patents·3 pending applications·9 citations·filing 2011–2023
79Inventor score
Top patents by PatentIndex Score
12 records- 0193US11668662B2Sample analysis apparatus and methodJEOL LTD·Filed 2021·Granted Jun 6, 2023·2 cites·12 claims
- 0284US10739284B2X-ray analyzer and spectrum generation methodJEOL LTD·Filed 2018·Granted Aug 11, 2020·4 cites·9 claims
- 0376US11131638B2Calibration method and analysis deviceJEOL LTD·Filed 2019·Granted Sep 28, 2021·1 cites·5 claims
- 0463US2024142395A1Analyzing Method and AnalyzerJEOL LTD·Filed 2023·Application pending·0 cites
- 0559US8421007B2X-ray detection systemTERAUCHI MASAMI·Filed 2011·Granted Apr 16, 2013·2 cites·5 claims
- 0656US11674913B2Sample analysis apparatus and methodJEOL LTD·Filed 2021·Granted Jun 13, 2023·0 cites·12 claims
- 0756US11536675B2Analytical method and apparatusJEOL LTD·Filed 2021·Granted Dec 27, 2022·0 cites·6 claims
- 0856US2022299457A1X-Ray Spectrum Analysis Apparatus and MethodJEOL LTD·Filed 2022·Application pending·0 cites
- 0955US11699567B2X-ray detection apparatus and methodJEOL LTD·Filed 2021·Granted Jul 11, 2023·0 cites·8 claims
- 1055US2022307996A1Spectrum Analysis Apparatus and Database Creation MethodJEOL LTD·Filed 2022·Application pending·0 cites
- 1154US11788976B2X-ray measurement apparatus and X-ray measurement methodJEOL LTD·Filed 2021·Granted Oct 17, 2023·0 cites·7 claims
- 1252US11353414B2Analysis device and spectrum generation methodJEOL LTD·Filed 2020·Granted Jun 7, 2022·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →