Inventor · disambiguated record
Tatsunori Murotani
Also filed as: MUROTANI TATSUNORI
13 granted patents·320 citations·filing 1978–1996
92Inventor score
Top patents by PatentIndex Score
13 records- 0192US5631872ALow power consumption semiconductor dynamic random access memory device by reusing residual electric charge on bit line pairsNEC CORP·Filed 1996·Granted May 20, 1997·117 cites·4 claims
- 0281US5309399ASemiconductor memoryNEC CORP·Filed 1992·Granted May 3, 1994·50 cites·7 claims
- 0376US5329490ADynamic semiconductor memory with refresh functionNEC CORP·Filed 1993·Granted Jul 12, 1994·39 cites·10 claims
- 0472US4553045ALogic circuit with improved hysteresis characteristicsNIPPON ELECTRIC CO·Filed 1983·Granted Nov 12, 1985·17 cites·12 claims
- 0571US4723227ARedundant type memory circuit with an improved clock generatorNEC CORP·Filed 1984·Granted Feb 2, 1988·20 cites·16 claims
- 0668US5159215ADecoder circuitNEC CORP·Filed 1991·Granted Oct 27, 1992·28 cites·21 claims
- 0767US4393477ATemperature responsive refresh control circuitNIPPON ELECTRIC CO·Filed 1980·Granted Jul 12, 1983·18 cites·6 claims
- 0864US4296339ALogic circuit comprising circuits for producing a faster and a slower inverted signalNIPPON ELECTRIC CO·Filed 1978·Granted Oct 20, 1981·10 cites·9 claims
- 0945US4733373ADynamic memory with improved arrangement for precharging bit linesNEC CORP·Filed 1986·Granted Mar 22, 1988·9 cites·12 claims
- 1036US5175707ASemiconductor memory device having a driving circuit provided in association with a high speed sense amplifier circuitNEC CORP·Filed 1990·Granted Dec 29, 1992·6 cites·4 claims
- 1135US5574696ADynamic ram device having high read operation speedFiled 1994·Granted Nov 12, 1996·5 cites·18 claims
- 1229US4875194ASemiconductor memory device with protection cellsNEC CORP·Filed 1988·Granted Oct 17, 1989·0 cites·8 claims
- 1329US4771322ASemiconductor memory device with low-noise structureNEC CORP·Filed 1986·Granted Sep 13, 1988·1 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →