Inventor · disambiguated record
Takayuki Nabeya
Also filed as: NABEYA TAKAYUKI
1 granted patent·1 pending application·35 citations·filing 1997–2002
46Inventor score
Files withTOSHIBA KK2
Top patents by PatentIndex Score
2 records- 0166US5983374ASemiconductor test system and method, and medium for recording test program thereforTOSHIBA KK·Filed 1997·Granted Nov 9, 1999·35 cites·44 claims
- 0235US2002143517A1Logical simulation system, logical simulation method and computer-readable recorded mediumTOSHIBA KK·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →