Inventor · disambiguated record
Takaaki Nagai
Also filed as: NAGAI TAKAAKI
84 granted patents·31 pending applications·914 citations·filing 1994–2025
99Inventor score
Files withSYSMEX CORP57NAGAI TAKAAKI23HONDA MOTOR CO LTD12NEC ELECTRONICS CORP9RENESAS ELECTRONICS CORP3
Top patents by PatentIndex Score
115 records- 0195US6772650B2Automatic sample analyzer and its componentsSYSMEX CORP·Filed 2002·Granted Aug 10, 2004·99 cites·9 claims
- 0295US6365106B1Sheath flow cell and blood analyzer using the sameSYSMEX CORP·Filed 2000·Granted Apr 2, 2002·74 cites·20 claims
- 0394US10401351B2Sample analyzer and computer program productSYSMEX CORP·Filed 2019·Granted Sep 3, 2019·3 cites·29 claims
- 0493US10151746B2Sample analyzer and computer program productSYSMEX CORP·Filed 2018·Granted Dec 11, 2018·3 cites·12 claims
- 0593US8865072B2Analysis apparatus and analysis methodNAGAI TAKAAKI·Filed 2010·Granted Oct 21, 2014·11 cites·17 claims
- 0692US11415575B2Sample analyzer and computer program productSYSMEX CORP·Filed 2018·Granted Aug 16, 2022·2 cites·8 claims
- 0792US8968653B2Sample analyzerSYSMEX CORP·Filed 2012·Granted Mar 3, 2015·9 cites·6 claims
- 0891US6138072ANavigation deviceHONDA MOTOR CO LTD·Filed 1998·Granted Oct 24, 2000·133 cites·8 claims
- 0990US8551404B2Sample analyzer and sample container supplying apparatusNAGAI TAKAAKI·Filed 2012·Granted Oct 8, 2013·8 cites·15 claims
- 1090US8440140B2Sample analyzer and computer program productNAGAI TAKAAKI·Filed 2008·Granted May 14, 2013·13 cites·6 claims
- 1189US9157925B2Specimen transporter, specimen testing system and specimen transporting methodSYSMEX CORP·Filed 2013·Granted Oct 13, 2015·9 cites·20 claims
- 1289US8206663B2Agitating deviceNAGAI TAKAAKI·Filed 2010·Granted Jun 26, 2012·7 cites·20 claims
- 1388US10401350B2Sample analyzer and computer program productSYSMEX CORP·Filed 2018·Granted Sep 3, 2019·3 cites·28 claims
- 1488US10234364B2Sample processing apparatus and rackSYSMEX CORP·Filed 2017·Granted Mar 19, 2019·4 cites·19 claims
- 1588US9933414B2Sample analyzer and computer program productSYSMEX CORP·Filed 2015·Granted Apr 3, 2018·2 cites·6 claims
- 1688US6114767AEEPROM semiconductor device and method of fabricating the sameNEC CORP·Filed 1998·Granted Sep 5, 2000·61 cites·5 claims
- 1787US8968661B2Sample analyzer and computer program productNAGAI TAKAAKI·Filed 2013·Granted Mar 3, 2015·3 cites·10 claims
- 1887US7879292B2Agitating deviceSYSMEX CORP·Filed 2006·Granted Feb 1, 2011·10 cites·5 claims
- 1986US6909269B2Particle detector and particle analyzer employing the sameSYSMEX CORP·Filed 2002·Granted Jun 21, 2005·29 cites·22 claims
- 2085US9816983B2Sample analyzerSYSMEX CORP·Filed 2015·Granted Nov 14, 2017·2 cites·9 claims
- 2185US9733161B2Sample processing apparatus and rackSYSMEX CORP·Filed 2014·Granted Aug 15, 2017·5 cites·16 claims
- 2285US2024402179A1Specimen measurement system and specimen measurement methodSYSMEX CORP·Filed 2024·Application pending·0 cites
- 2384US8841117B2Hematological analyzer, method for analyzing body fluid and computer program productNAGAI TAKAAKI·Filed 2008·Granted Sep 23, 2014·9 cites·16 claims
- 2483US11921106B2Sample analyzer and computer program productSYSMEX CORP·Filed 2022·Granted Mar 5, 2024·0 cites·10 claims
- 2582US11226279B2Sample preparation apparatus, sample preparation system, sample preparation method, and particle analyzerSYSMEX CORP·Filed 2018·Granted Jan 18, 2022·1 cites·23 claims
- 2682US7834390B2Nonvolatile semiconductor memory device and method of manufacturing the sameNEC ELECTRONICS CORP·Filed 2009·Granted Nov 16, 2010·9 cites·7 claims
- 2780US8158060B2Sample analyzer and sample container supplying apparatusNAGAI TAKAAKI·Filed 2006·Granted Apr 17, 2012·9 cites·4 claims
- 2880US2025389663A1Measurement apparatus and analysis methodSYSMEX CORP·Filed 2025·Application pending·0 cites
- 2979US8652848B2Sample measuring apparatus and sample measuring methodNAGAI TAKAAKI·Filed 2012·Granted Feb 18, 2014·2 cites·6 claims
- 3079US8546866B2Nonvolatile semiconductor memory device capable of preventing a silicide shortNAGAI TAKAAKI·Filed 2010·Granted Oct 1, 2013·5 cites·5 claims
- 3178US2024142482A1Specimen measurement apparatus and specimen transport deviceSYSMEX CORP·Filed 2023·Application pending·0 cites
- 3278US2025369993A1Analysis systemSYSMEX CORP·Filed 2025·Application pending·0 cites
- 3378US2025369992A1Analysis systemSYSMEX CORP·Filed 2025·Application pending·0 cites
- 3477US10031151B2Analysis device and reagent containerSYSMEX CORP·Filed 2016·Granted Jul 24, 2018·1 cites·10 claims
- 3577US8920724B2Specimen processing apparatusNAGAI TAKAAKI·Filed 2009·Granted Dec 30, 2014·4 cites·17 claims
- 3677US2019339258A1Sample analyzer and computer program productSYSMEX CORP·Filed 2019·Application pending·0 cites
- 3776US11372110B2Image display apparatusHONDA MOTOR CO LTD·Filed 2019·Granted Jun 28, 2022·2 cites·5 claims
- 3876US2022221461A1Specimen measurement system and specimen measurement methodSYSMEX CORP·Filed 2022·Application pending·0 cites
- 3975US9233371B2Connection device and analyzerNAKAMURA YOICHI·Filed 2010·Granted Jan 12, 2016·5 cites·15 claims
- 4075US9194866B2Sample analyzerSYSMEX CORP·Filed 2013·Granted Nov 24, 2015·2 cites·19 claims
- 4175US5826212ACurrent-position map and three dimensional guiding objects displaying device for vehicleHONDA MOTOR CO LTD·Filed 1995·Granted Oct 20, 1998·49 cites·5 claims
- 4274US11346841B2Specimen measurement system and specimen measurement methodSYSMEX CORP·Filed 2019·Granted May 31, 2022·0 cites·22 claims
- 4374US9638709B2Analysis apparatus and analysis methodSYSMEX CORP·Filed 2014·Granted May 2, 2017·1 cites·20 claims
- 4474US8377774B2Split gate type non-volatile semiconductor memory device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2012·Granted Feb 19, 2013·3 cites·7 claims
- 4574US8347743B2Specimen processing device and specimen processing methodSYSMEX CORP·Filed 2010·Granted Jan 8, 2013·2 cites·18 claims
- 4674US2022357248A1Smear staining apparatus, smear preparing apparatus, and smear staining methodSYSMEX CORP·Filed 2022·Application pending·0 cites
- 4773US12429424B2Measurement apparatus and analysis methodSYSMEX CORP·Filed 2023·Granted Sep 30, 2025·0 cites·22 claims
- 4873US11971342B2Sample preparation apparatus, sample preparation system, sample preparation method, and particle analyzerSYSMEX CORP·Filed 2021·Granted Apr 30, 2024·0 cites·20 claims
- 4973US9377383B2Specimen processing apparatusSYSMEX CORP·Filed 2014·Granted Jun 28, 2016·1 cites·20 claims
- 5073US9243993B2Sample analyzer and sample analyzing methodNAGAI TAKAAKI·Filed 2006·Granted Jan 26, 2016·4 cites·20 claims
Showing the top 50 of 115 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →