Inventor · disambiguated record
Takahiro Nagasawa
Also filed as: NAGASAWA TAKAHIRO
4 granted patents·1 pending application·3 citations·filing 2017–2022
57Inventor score
Technology areasH10P
Files withSUMCO CORP5
Top patents by PatentIndex Score
5 records- 0177US10261125B2Semiconductor wafer evaluation standard setting method, semiconductor wafer evaluation method, semiconductor wafer manufacturing process evaluation method, and semiconductor wafer manufacturing methodSUMCO CORP·Filed 2017·Granted Apr 16, 2019·3 cites·9 claims
- 0249US2024230553A1Method of evaluating silicon single-crystal ingot, method of evaluating silicon epitaxial wafer, method of manufacturing silicon epitaxial wafer, and method of evaluating silicon mirror polished waferSUMCO CORP·Filed 2022·Application pending·0 cites
- 0342US12188880B2Method of calibrating coordinate position identification accuracy of laser surface inspection apparatus and method of evaluating semiconductor waferSUMCO CORP·Filed 2020·Granted Jan 7, 2025·0 cites·5 claims
- 0442US12027428B2Semiconductor wafer evaluation method and manufacturing method and semiconductor wafer manufacturing process management methodSUMCO CORP·Filed 2019·Granted Jul 2, 2024·0 cites·9 claims
- 0541US11955390B2Semiconductor wafer evaluation method and semiconductor wafer manufacturing methodSUMCO CORP·Filed 2019·Granted Apr 9, 2024·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →