Inventor · disambiguated record
Takahisa Nakako
Also filed as: NAKAKO TAKAHISA
3 granted patents·29 citations·filing 1998–2019
64Inventor score
Top patents by PatentIndex Score
3 records- 0170US8281278B2System and method for supporting design of semiconductor integrated circuit including processing scan chainsNAKAKO TAKAHISA·Filed 2010·Granted Oct 2, 2012·5 cites·8 claims
- 0245US6044214AFault simulation method operable at a high speedNEC CORP·Filed 1998·Granted Mar 28, 2000·24 cites·14 claims
- 0338US11005458B2Semiconductor integrated circuit adapted to scan testing, and method of designing the sameSYNAPTICS INC·Filed 2019·Granted May 11, 2021·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →