Inventor · disambiguated record
Takakuni Nasu
Also filed as: NASU TAKAKUNI
8 granted patents·4 pending applications·6 citations·filing 2002–2020
75Inventor score
Files withNGK SPARK PLUG CO11
Top patents by PatentIndex Score
12 records- 0174US10433433B2Wiring substrate for electronic component inspection apparatusNGK SPARK PLUG CO·Filed 2018·Granted Oct 1, 2019·2 cites·6 claims
- 0270US9903887B2Wiring board for device testingNGK SPARK PLUG CO·Filed 2016·Granted Feb 27, 2018·3 cites·4 claims
- 0364US10674614B2Wiring substrate for electronic component inspection apparatusNGK SPARK PLUG CO·Filed 2018·Granted Jun 2, 2020·1 cites·4 claims
- 0445US10834818B2Wiring boardNGK SPARK PLUG CO·Filed 2019·Granted Nov 10, 2020·0 cites·4 claims
- 0545US9107334B2Ceramic substrate and method of manufacturing the sameNGK SPARK PLUG CO·Filed 2012·Granted Aug 11, 2015·0 cites·10 claims
- 0643US10729006B2Wiring substrate for electronic component inspection apparatusNGK SPARK PLUG CO·Filed 2018·Granted Jul 28, 2020·0 cites·7 claims
- 0741US2009051041A1Multilayer wiring substrate and method for manufacturing the same, and substrate for use in ic inspection device and method for manufacturing the sameNGK SPARK PLUG CO·Filed 2008·Application pending·0 cites
- 0838US10887991B2Wiring substrate for inspection apparatusNGK SPARK PLUG CO·Filed 2019·Granted Jan 5, 2021·0 cites·4 claims
- 0937US10834812B2Wiring boardNGK SPARK PLUG CO·Filed 2019·Granted Nov 10, 2020·0 cites·4 claims
- 1035US2022108943A1Multilayer wiring substrateNGK SPARK PLUG CO·Filed 2020·Application pending·0 cites
- 1129US2003003862A1Electronic component and mobile communication device using the electronic componentFiled 2002·Application pending·0 cites
- 1227US2016099163A1Semiconductor manufacturing equipment component and method of making the sameNGK SPARK PLUG CO·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Takakuni Nasu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →