Inventor · disambiguated record
Takumi Nasu
Also filed as: NASU TAKUMI
20 granted patents·2 pending applications·632 citations·filing 1990–2025
96Inventor score
Files withTEXAS INSTRUMENTS INC11HITACHI LTD2LUTZ PUMPEN GMBH2MICRON TECHNOLOGY INC2NAKANISHI TAKUYA2
Top patents by PatentIndex Score
22 records- 0194US5689465ASemiconductor memory device and defective memory cell correction circuitTEXAS INSTRUMENTS INC·Filed 1996·Granted Nov 18, 1997·114 cites·7 claims
- 0287US5485425ASemiconductor memory device having redundant column and operation method thereofHITACHI LTD·Filed 1995·Granted Jan 16, 1996·70 cites·15 claims
- 0386US5297086AMethod for initializing redundant circuitryTEXAS INSTRUMENTS INC·Filed 1992·Granted Mar 22, 1994·61 cites·5 claims
- 0482US6373745B2Semiconductor memory cell and semiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 2001·Granted Apr 16, 2002·43 cites·17 claims
- 0580US5550394ASemiconductor memory device and defective memory cell correction circuitTEXAS INSTRUMENTS INC·Filed 1993·Granted Aug 27, 1996·41 cites·6 claims
- 0679US6178136B1Semiconductor memory device having Y-select gate voltage that varies according to memory cell access operationTEXAS INSTRUMENTS INC·Filed 1999·Granted Jan 23, 2001·44 cites·20 claims
- 0779US5208776APulse generation circuitTEXAS INSTRUMENTS INC·Filed 1990·Granted May 4, 1993·42 cites·8 claims
- 0878US6249472B1Semiconductor memory device with antifuseTEXAS INSTRUMENTS INC·Filed 1998·Granted Jun 19, 2001·63 cites·20 claims
- 0977US7515501B2Memory architecture having local column select linesMICRON TECHNOLOGY INC·Filed 2007·Granted Apr 7, 2009·11 cites·26 claims
- 1071US2025065503A1Collision prediction method, collision prediction device, and welding systemKOBE STEEL LTD·Filed 2024·Application pending·0 cites
- 1170US6038191ACircuit for reducing stand-by current induced by defects in memory arrayTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 14, 2000·38 cites·76 claims
- 1270US5594279ASemiconductor device having shield wiring for noise suppressionTEXAS INSTRUMENTS INC·Filed 1993·Granted Jan 14, 1997·42 cites·10 claims
- 1369US8223583B2Row addressingNAKANISHI TAKUYA·Filed 2011·Granted Jul 17, 2012·3 cites·21 claims
- 1469US5394008ASemiconductor integrated circuit deviceHITACHI LTD·Filed 1993·Granted Feb 28, 1995·40 cites·30 claims
- 1565US8068380B2Block repair schemeNASU TAKUMI·Filed 2008·Granted Nov 29, 2011·5 cites·11 claims
- 1660US7933162B2Row addressingMICRON TECHNOLOGY INC·Filed 2008·Granted Apr 26, 2011·3 cites·15 claims
- 1759US2025250975A1Multiple displacement pumpLUTZ PUMPEN GMBH·Filed 2025·Application pending·0 cites
- 1841US8743650B2Block repair schemeNASU TAKUMI·Filed 2011·Granted Jun 3, 2014·0 cites·19 claims
- 1940US12018669B2Multiple diaphragm pump with magnetic actuation of the spool valve to avoid a dead zoneLUTZ PUMPEN GMBH·Filed 2022·Granted Jun 25, 2024·0 cites·8 claims
- 2040US5461586ASelf-timed redundancy circuitTEXAS INSTRUMENTS INC·Filed 1994·Granted Oct 24, 1995·7 cites·18 claims
- 2136US9406404B2Column redundancy system for a memory arrayNAKANISHI TAKUYA·Filed 2007·Granted Aug 2, 2016·0 cites·20 claims
- 2236US5875194ARepairing efficiency by gray codeTEXAS INSTRUMENTS INC·Filed 1993·Granted Feb 23, 1999·5 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →