Inventor · disambiguated record
Takanori Ninomiya
Also filed as: NINOMIYA TAKANORI
68 granted patents·3 pending applications·2,582 citations·filing 1983–2019
99Inventor score
Files withHITACHI LTD50HITACHI AUTOMOTIVE SYSTEMS LTD3HITACHI COMP PRODUCTS EUROP S A S3HITACHI HIGH TECH CORP3SEIKO EPSON CORP3
Top patents by PatentIndex Score
71 records- 0198US6583413B1Method of inspecting a circuit pattern and inspecting instrumentHITACHI LTD·Filed 2000·Granted Jun 24, 2003·123 cites·14 claims
- 0297US7098055B2Apparatus and method for testing defectsHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 29, 2006·36 cites·7 claims
- 0396US10348214B2Power module, power converter device, and electrically powered vehicleHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2017·Granted Jul 9, 2019·13 cites·10 claims
- 0496US7940383B2Method of detecting defects on an objectHITACHI LTD·Filed 2009·Granted May 10, 2011·42 cites·20 claims
- 0596US7639350B2Apparatus and method for testing defectsHITACHI LTD·Filed 2007·Granted Dec 29, 2009·25 cites·20 claims
- 0696US6411377B1Optical apparatus for defect and particle size inspectionHITACHI LTD·Filed 1999·Granted Jun 25, 2002·174 cites·29 claims
- 0795US6400454B1Apparatus and method for inspector defectsHITACHI LTD·Filed 2000·Granted Jun 4, 2002·67 cites·20 claims
- 0895US4611292ARobot vision systemHITACHI LTD·Filed 1983·Granted Sep 9, 1986·80 cites·32 claims
- 0994US7671948B2Liquid crystal device and electronic apparatusSEIKO EPSON CORP·Filed 2007·Granted Mar 2, 2010·23 cites·11 claims
- 1094US7061602B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 13, 2006·18 cites·13 claims
- 1193US7443496B2Apparatus and method for testing defectsHITACHI LTD·Filed 2007·Granted Oct 28, 2008·16 cites·15 claims
- 1292US8946567B2Power module, power converter device, and electrically powered vehicleNAKATSU KINYA·Filed 2009·Granted Feb 3, 2015·19 cites·14 claims
- 1392US7037735B2Apparatus and method for testing defectsHITACHI HIGH TECH CORP·Filed 2002·Granted May 2, 2006·43 cites·18 claims
- 1492US6753972B1Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the sameHITACHI LTD·Filed 1999·Granted Jun 22, 2004·87 cites·22 claims
- 1592US5883437AMethod and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereofHITACHI LTD·Filed 1995·Granted Mar 16, 1999·175 cites·13 claims
- 1692US5278012AMethod for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrateHITACHI LTD·Filed 1992·Granted Jan 11, 1994·237 cites·23 claims
- 1791US7692779B2Apparatus and method for testing defectsHITACHI LTD·Filed 2005·Granted Apr 6, 2010·12 cites·20 claims
- 1891US7417723B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2006·Granted Aug 26, 2008·10 cites·12 claims
- 1991US4575304ARobot system for recognizing three dimensional shapesHITACHI LTD·Filed 1983·Granted Mar 11, 1986·119 cites·18 claims
- 2090US11139748B2Power module, power converter device, and electrically powered vehicleHITACHI ASTEMO LTD·Filed 2019·Granted Oct 5, 2021·4 cites·3 claims
- 2190US7397031B2Method of inspecting a circuit pattern and inspecting instrumentHITACHI LTD·Filed 2006·Granted Jul 8, 2008·10 cites·7 claims
- 2290US6888959B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI HIGH TECH ELECT ENG CO·Filed 2001·Granted May 3, 2005·38 cites·20 claims
- 2389US9729076B2Power module, power converter device, and electrically powered vehicleHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2016·Granted Aug 8, 2017·5 cites·8 claims
- 2489US5479259AMethod and apparatus for detecting photoacoustic signalHITACHI LTD·Filed 1992·Granted Dec 26, 1995·76 cites·21 claims
- 2589US4791586AMethod of and apparatus for checking geometry of multi-layer patterns for IC structuresHITACHI LTD·Filed 1985·Granted Dec 13, 1988·99 cites·30 claims
- 2688US8590593B2Roller shade apparatus for vehicleKITANI TAKASHI·Filed 2010·Granted Nov 26, 2013·14 cites·11 claims
- 2788US6792359B2Method for inspecting defect and system thereforHITACHI LTD·Filed 2001·Granted Sep 14, 2004·29 cites·16 claims
- 2888US6614923B1Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereofHITACHI LTD·Filed 1999·Granted Sep 2, 2003·49 cites·30 claims
- 2988US6576559B2Semiconductor manufacturing methods, plasma processing methods and plasma processing apparatusesHITACHI LTD·Filed 2002·Granted Jun 10, 2003·32 cites·22 claims
- 3088US4772125AApparatus and method for inspecting soldered portionsHITACHI LTD·Filed 1986·Granted Sep 20, 1988·82 cites·6 claims
- 3187US7098455B2Method of inspecting a circuit pattern and inspecting instrumentHITACHI LTD·Filed 2003·Granted Aug 29, 2006·26 cites·5 claims
- 3286US8274651B2Method of inspecting a semiconductor device and an apparatus thereofHAMAMATSU AKIRA·Filed 2011·Granted Sep 25, 2012·3 cites·14 claims
- 3386US6760472B1Identification method for an article using crystal defectsHITACHI LTD·Filed 1999·Granted Jul 6, 2004·69 cites·8 claims
- 3486US6087673AMethod of inspecting pattern and apparatus thereofHITACHI LTD·Filed 1998·Granted Jul 11, 2000·58 cites·29 claims
- 3585US7643138B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2008·Granted Jan 5, 2010·5 cites·12 claims
- 3685US7619414B2NMR probe and NMR spectrometerHITACHI LTD·Filed 2007·Granted Nov 17, 2009·13 cites·22 claims
- 3785US5780866AMethod and apparatus for automatic focusing and a method and apparatus for three dimensional profile detectionHITACHI LTD·Filed 1995·Granted Jul 14, 1998·62 cites·26 claims
- 3884US5781294AMethod and apparatus for detecting photoacoustic signal to detect surface and subsurface information of the specimenHITACHI LTD·Filed 1995·Granted Jul 14, 1998·77 cites·25 claims
- 3983US9407163B2Power module, power converter device, and electrically powered vehicleHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2014·Granted Aug 2, 2016·4 cites·4 claims
- 4082US8040503B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2010·Granted Oct 18, 2011·2 cites·12 claims
- 4181US6654112B2Apparatus and method for inspecting defectsHITACHI LTD·Filed 2002·Granted Nov 25, 2003·16 cites·16 claims
- 4281US6236057B1Method of inspecting pattern and apparatus thereof with a differential brightness image detectionHITACHI LTD·Filed 2000·Granted May 22, 2001·15 cites·23 claims
- 4379US7962311B2Method using capacitive sensors for morphology discrimination of a passenger seating in an automotive seatHITACHI COMP PRODUCTS EUROP S A S·Filed 2007·Granted Jun 14, 2011·13 cites·25 claims
- 4477US4654583AMethod and apparatus for detecting defects of printed circuit patternsHITACHI LTD·Filed 1984·Granted Mar 31, 1987·32 cites·22 claims
- 4576US5989928AMethod and device for detecting end point of plasma treatment, method and device for manufacturing semiconductor device, and semiconductor deviceHITACHI LTD·Filed 1996·Granted Nov 23, 1999·46 cites·17 claims
- 4675US4953224APattern defects detection method and apparatusHITACHI LTD·Filed 1988·Granted Aug 28, 1990·55 cites·7 claims
- 4773US7263216B2Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereofHITACHI LTD·Filed 2003·Granted Aug 28, 2007·16 cites·16 claims
- 4873US6376854B2Method of inspecting a pattern on a substrateHITACHI LTD·Filed 2001·Granted Apr 23, 2002·8 cites·10 claims
- 4973US6166380AResolving power evaluation method and specimen for electron microscopeHITACHI LTD·Filed 1998·Granted Dec 26, 2000·30 cites·9 claims
- 5073US5645351ATemperature measuring method using thermal expansion and an apparatus for carrying out the sameHITACHI LTD·Filed 1994·Granted Jul 8, 1997·34 cites·32 claims
Showing the top 50 of 71 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →