Inventor · disambiguated record
Tatsuji Nishijima
Also filed as: NISHIJIMA TATSUJI
42 granted patents·3 pending applications·221 citations·filing 2005–2020
97Inventor score
Files withSEMICONDUCTOR ENERGY LAB22NISHIJIMA TATSUJI11HAYAKAWA MASAHIKO2KOBAYASHI HIDETOMO2YONEDA SEIICHI2
Top patents by PatentIndex Score
45 records- 0195US9477294B2Microcontroller and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Oct 25, 2016·27 cites·20 claims
- 0295US8581625B2Programmable logic deviceYONEDA SEIICHI·Filed 2012·Granted Nov 12, 2013·19 cites·18 claims
- 0395US8476927B2Programmable logic deviceNISHIJIMA TATSUJI·Filed 2012·Granted Jul 2, 2013·20 cites·6 claims
- 0495US8184923B2Image analysis method, image analysis program, pixel evaluation system having the image analysis method, and pixel evaluation system having the image analysis programHAYAKAWA MASAHIKO·Filed 2005·Granted May 22, 2012·16 cites·38 claims
- 0592US10002580B2Semiconductor display deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Jun 19, 2018·5 cites·9 claims
- 0692US9478704B2Semiconductor display deviceSEMICONDUCTOR ENERGY LAB·Filed 2012·Granted Oct 25, 2016·8 cites·12 claims
- 0791US10630176B2Central control systemSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted Apr 21, 2020·6 cites·6 claims
- 0891US8340457B2Image analysis method, image analysis program and pixel evaluation system having the samesHAYAKAWA MASAHIKO·Filed 2011·Granted Dec 25, 2012·7 cites·34 claims
- 0990US10324521B2Microcontroller and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Jun 18, 2019·6 cites·22 claims
- 1086US8754693B2Latch circuit and semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Jun 17, 2014·7 cites·22 claims
- 1185US9819261B2Central control systemSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Nov 14, 2017·6 cites·17 claims
- 1285US8953358B2Memory device and method for driving memory deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Feb 10, 2015·9 cites·20 claims
- 1385US8922182B2DC converter circuit and power supply circuitTAKAHASHI KEI·Filed 2010·Granted Dec 30, 2014·7 cites·19 claims
- 1483US8624239B2Semiconductor deviceNISHIJIMA TATSUJI·Filed 2011·Granted Jan 7, 2014·7 cites·17 claims
- 1581US9344090B2Programmable logic deviceNISHIJIMA TATSUJI·Filed 2012·Granted May 17, 2016·6 cites·26 claims
- 1681US9105353B2Memory device and semiconductor device including the memory deviceNISHIJIMA TATSUJI·Filed 2012·Granted Aug 11, 2015·6 cites·20 claims
- 1781US8674738B2Semiconductor deviceNISHIJIMA TATSUJI·Filed 2012·Granted Mar 18, 2014·5 cites·18 claims
- 1881US7970200B2Pattern inspection method and apparatusSEMICONDUCTOR ENERGY LAB·Filed 2010·Granted Jun 28, 2011·5 cites·6 claims
- 1979US9423860B2Microcontroller capable of being in three modesSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Aug 23, 2016·5 cites·22 claims
- 2079US8570065B2Programmable LSIKOBAYASHI HIDETOMO·Filed 2012·Granted Oct 29, 2013·5 cites·15 claims
- 2178US9490241B2Semiconductor device comprising a first inverter and a second inverterNOMURA MASUMI·Filed 2012·Granted Nov 8, 2016·5 cites·18 claims
- 2276US9207751B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Dec 8, 2015·4 cites·19 claims
- 2376US8439270B2Semiconductor device and wireless tag using the sameNISHIJIMA TATSUJI·Filed 2009·Granted May 14, 2013·5 cites·14 claims
- 2475US9165942B2Programmable logic deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Oct 20, 2015·3 cites·18 claims
- 2575US8816722B2Current detection circuitNISHIJIMA TATSUJI·Filed 2011·Granted Aug 26, 2014·3 cites·18 claims
- 2674US9176571B2Microprocessor and method for driving microprocessorSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Nov 3, 2015·3 cites·9 claims
- 2774US8698521B2Semiconductor deviceNISHIJIMA TATSUJI·Filed 2012·Granted Apr 15, 2014·3 cites·10 claims
- 2872US8540161B2Semiconductor device and method for manufacturing the sameSHIONOIRI YUTAKA·Filed 2011·Granted Sep 24, 2013·3 cites·31 claims
- 2969US9270173B2DC converter circuit and power supply circuitSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Feb 23, 2016·2 cites·16 claims
- 3068US9900007B2Programmable logic deviceSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted Feb 20, 2018·1 cites·4 claims
- 3168US2020336066A1Central control systemSEMICONDUCTOR ENERGY LAB·Filed 2020·Application pending·0 cites
- 3267US7769226B2Pattern inspection method and apparatusSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted Aug 3, 2010·3 cites·7 claims
- 3365US9607975B2Semiconductor device and wireless tag using the sameSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Mar 28, 2017·1 cites·18 claims
- 3461US9595964B2Programmable logic deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Mar 14, 2017·1 cites·14 claims
- 3554US9214587B2Photoelectric conversion module and manufacturing method thereofNISHI KAZUO·Filed 2011·Granted Dec 15, 2015·0 cites·18 claims
- 3651US9048825B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Jun 2, 2015·0 cites·21 claims
- 3750US9748400B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Aug 29, 2017·0 cites·24 claims
- 3850US8948696B2Modulation circuit and semiconductor device including the sameYAMASHITA YUKIKO·Filed 2009·Granted Feb 3, 2015·2 cites·22 claims
- 3949US8311315B2Pattern inspection method and apparatusOGUNI TEPPEI·Filed 2011·Granted Nov 13, 2012·0 cites·10 claims
- 4048US2009265560A1Numbering Method, Numbering Device, and Laser Direct Drawing ApparatusSEMICONDUCTOR ENERGY LAB·Filed 2009·Application pending·0 cites
- 4147US2007257775A1Identification system and identification methodNISHIJIMA TATSUJI·Filed 2007·Application pending·0 cites
- 4245US8824194B2Semiconductor device and method for driving the sameKOBAYASHI HIDETOMO·Filed 2012·Granted Sep 2, 2014·0 cites·6 claims
- 4344US9092710B2Semiconductor deviceNISHIJIMA TATSUJI·Filed 2011·Granted Jul 28, 2015·0 cites·16 claims
- 4442US8884470B2Semiconductor deviceNISHIJIMA TATSUJI·Filed 2011·Granted Nov 11, 2014·0 cites·26 claims
- 4541US9059704B2Programmable logic deviceYONEDA SEIICHI·Filed 2012·Granted Jun 16, 2015·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →