Inventor · disambiguated record
Takuma Nishimoto
Also filed as: NISHIMOTO TAKUMA
15 granted patents·3 pending applications·8 citations·filing 2011–2024
85Inventor score
Top patents by PatentIndex Score
18 records- 0177US10818470B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Oct 27, 2020·2 cites·6 claims
- 0275US10546718B2High voltage power supply device and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jan 28, 2020·2 cites·10 claims
- 0370US11369993B2Ultrasonic diagnostic apparatusHITACHI LTD·Filed 2018·Granted Jun 28, 2022·2 cites·15 claims
- 0467US9859094B2Charged particle beam apparatus and image forming method of charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 2, 2018·1 cites·10 claims
- 0559US10448923B2Amplifier circuit and ultrasonic probeHITACHI LTD·Filed 2014·Granted Oct 22, 2019·1 cites·7 claims
- 0657US2025148177A1Circuit Design Support DeviceHITACHI LTD·Filed 2024·Application pending·0 cites
- 0756US11962051B2Electrolyte material for solid oxide fuel cell and method for producing precursor thereforSAKAI CHEMICAL INDUSTRY CO·Filed 2019·Granted Apr 16, 2024·0 cites·14 claims
- 0852US12066582B2Signal detection device, measurement device, and mass spectrometerHITACHI HIGH TECH CORP·Filed 2022·Granted Aug 20, 2024·0 cites·14 claims
- 0950US10856845B2Ultrasound probe and ultrasound diagnosis device using the sameHITACHI LTD·Filed 2016·Granted Dec 8, 2020·0 cites·14 claims
- 1049US10799213B2Ultrasound probe, element circuit thereof, and ultrasound diagnostic device using sameHITACHI LTD·Filed 2014·Granted Oct 13, 2020·0 cites·8 claims
- 1148US12224168B2Mass spectrometer and mass spectrometry methodHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 11, 2025·0 cites·13 claims
- 1246US10458956B2Ultrasonic probe and ultrasonic diagnosis device provided with sameHITACHI LTD·Filed 2015·Granted Oct 29, 2019·0 cites·10 claims
- 1344US10595822B2Ultrasonic-wave probe, ultrasonic-wave diagnosis apparatus, and test method of ultrasonic-wave probeHITACHI LTD·Filed 2016·Granted Mar 24, 2020·0 cites·15 claims
- 1442US12051581B2Power supply module and mass spectrometerHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 30, 2024·0 cites·15 claims
- 1542US10796880B2Charged particle beam device and charged particle beam device noise source determination methodHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 6, 2020·0 cites·10 claims
- 1641US11349476B2High-voltage amplifier, high-voltage power supply, and mass spectrometerHITACHI HIGH TECH CORP·Filed 2018·Granted May 31, 2022·0 cites·11 claims
- 1738US2012194939A1Patterned medium inspection method and inspection apparatusNISHIMOTO TAKUMA·Filed 2011·Application pending·0 cites
- 1837US2011211277A1Detecting circuit and inspecting apparatusNISHIMOTO TAKUMA·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →