Inventor · disambiguated record
Takashi Nobuhara
Also filed as: NOBUHARA TAKASHI
3 granted patents·1 pending application·0 citations·filing 2009–2021
38Inventor score
Files withHITACHI HIGH TECH CORP4
Top patents by PatentIndex Score
4 records- 0152US11557457B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Jan 17, 2023·0 cites·11 claims
- 0251US11195694B2Charged particle beam system, method for determining range for automatically searching for focal point position in charged particle beam device, and non-transitory storage medium recording program for causing computer system to determine range for automatically searching for focal position in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 7, 2021·0 cites·13 claims
- 0345US10770260B2Defect observation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 8, 2020·0 cites·14 claims
- 0440US2009309043A1Charged particle beam apparatus and sample holding systemHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Takashi Nobuhara files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →