Inventor · disambiguated record
Tatsushi Nomura
Also filed as: NOMURA TATSUSHI
10 granted patents·1 pending application·318 citations·filing 1994–2022
90Inventor score
Files withNIKON CORP11
Top patents by PatentIndex Score
11 records- 0192US5537863AScanning probe microscope having a cantilever used thereinNIKON CORP·Filed 1994·Granted Jul 23, 1996·77 cites·59 claims
- 0282US9535241B2Structured illuminating microscopy and structured illuminating observation methodNIKON CORP·Filed 2013·Granted Jan 3, 2017·5 cites·13 claims
- 0381US5689063AAtomic force microscope using cantilever attached to optical microscopeNIKON CORP·Filed 1995·Granted Nov 18, 1997·70 cites·6 claims
- 0478US5794080APiezoelectric vibration angular velocity meter and camera using the sameNIKON CORP·Filed 1996·Granted Aug 11, 1998·62 cites·9 claims
- 0577US9146393B2Structured illumination apparatus, structured illumination microscopy, and structured illumination methodNIKON CORP·Filed 2013·Granted Sep 29, 2015·4 cites·19 claims
- 0676US5765046APiezoelectric vibration angular velocity meter and camera using the sameNIKON CORP·Filed 1996·Granted Jun 9, 1998·63 cites·14 claims
- 0766US5796000AVibration angular-velocity sensor and process for producing itNIKON CORP·Filed 1996·Granted Aug 18, 1998·36 cites·4 claims
- 0863US9709785B2Structured illumination apparatus, structured illumination microscopy apparatus, and profile measuring apparatusNIKON CORP·Filed 2013·Granted Jul 18, 2017·1 cites·24 claims
- 0962US2025196261A1Processing apparatusNIKON CORP·Filed 2022·Application pending·0 cites
- 1055US10228552B2Structured illuminating microscopy and structured illuminating observation methodNIKON CORP·Filed 2016·Granted Mar 12, 2019·0 cites·15 claims
- 1139US7940309B2Optical low pass filter and image-capturing deviceNIKON CORP·Filed 2005·Granted May 10, 2011·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →