Inventor · disambiguated record
Takuo Ohashi
Also filed as: OHASHI TAKUO
25 granted patents·8 pending applications·115 citations·filing 1999–2019
94Inventor score
Top patents by PatentIndex Score
33 records- 0197US9166032B1Non-volatile memory deviceTOSHIBA KK·Filed 2014·Granted Oct 20, 2015·36 cites·20 claims
- 0288US10186521B2Semiconductor device and method for manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Jan 22, 2019·5 cites·1 claims
- 0388US9754954B2Non-volatile memory deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Sep 5, 2017·4 cites·12 claims
- 0480US9406691B2Non-volatile memory deviceTOSHIBA KK·Filed 2015·Granted Aug 2, 2016·2 cites·11 claims
- 0579US10332904B2Semiconductor memory device and method for manufacturing sameTOSHIBA MEMORY CORP·Filed 2017·Granted Jun 25, 2019·2 cites·6 claims
- 0678US8053776B2Vertical diode and method for manufacturing same and semiconductor memory deviceTOSHIBA KK·Filed 2009·Granted Nov 8, 2011·7 cites·20 claims
- 0777US6448157B1Fabrication process for a semiconductor deviceNEC CORP·Filed 2000·Granted Sep 10, 2002·32 cites·12 claims
- 0876US11195744B2Substrate treatment apparatus and manufacturing method of a semiconductor deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Dec 7, 2021·2 cites·4 claims
- 0973US7902030B2Manufacturing method for semiconductor device and semiconductor deviceTOSHIBA KK·Filed 2009·Granted Mar 8, 2011·3 cites·9 claims
- 1071US8105959B2Method for manufacturing a semiconductor device having a nitrogen-containing gate insulating filmOHASHI TAKUO·Filed 2007·Granted Jan 31, 2012·4 cites·18 claims
- 1167US7670954B2Method of manufacturing semiconductor deviceELPIDA MEMORY INC·Filed 2007·Granted Mar 2, 2010·3 cites·13 claims
- 1262US8309450B2Method for fabricating semiconductor deviceOHASHI TAKUO·Filed 2011·Granted Nov 13, 2012·2 cites·18 claims
- 1361US9027588B2Pressure control deviceKUSUNOKI MARI·Filed 2012·Granted May 12, 2015·2 cites·8 claims
- 1461US7592234B2Method for forming a nitrogen-containing gate insulating filmELPIDA MEMORY INC·Filed 2007·Granted Sep 22, 2009·1 cites·13 claims
- 1556US10593696B2Semiconductor memory device and method for manufacturing sameTOSHIBA MEMORY CORP·Filed 2019·Granted Mar 17, 2020·0 cites·4 claims
- 1652US10283517B2Semiconductor memory device and method of manufacturing the sameTOSHIBA MEMORY CORP·Filed 2017·Granted May 7, 2019·0 cites·12 claims
- 1751US7786539B2Dieletric film layered productELPIDA MEMORY INC·Filed 2008·Granted Aug 31, 2010·0 cites·8 claims
- 1850US9793290B2Method of manufacturing semiconductor memory device having charge accumulation layer positioned between control gate electrode and semiconductor layerTOSHIBA MEMORY CORP·Filed 2016·Granted Oct 17, 2017·0 cites·5 claims
- 1950US8148717B2Manufacturing method for semiconductor device and semiconductor deviceITO TAKAYUKI·Filed 2011·Granted Apr 3, 2012·0 cites·7 claims
- 2047US9012973B2Semiconductor memory device and method for manufacturing the sameTOSHIBA KK·Filed 2013·Granted Apr 21, 2015·0 cites·15 claims
- 2147US7163871B2Manufacturing method of semiconductor device and oxidization method of semiconductor substrateELPIDA MEMORY INC·Filed 2004·Granted Jan 16, 2007·3 cites·4 claims
- 2245US9960174B2Semiconductor device and method for manufacturing the sameTOSHIBA MEMORY CORP·Filed 2016·Granted May 1, 2018·0 cites·12 claims
- 2343US7700431B2Method for manufacturing a semiconductor device having polysilicon plugsELPIDA MEMORY INC·Filed 2005·Granted Apr 20, 2010·0 cites·20 claims
- 2443US6291311B2Semiconductor device and method for producing sameNEC CORP·Filed 2001·Granted Sep 18, 2001·1 cites·8 claims
- 2542US2009072329A1Semiconductor device and method of manufacturing the sameELPIDA MEMORY INC·Filed 2008·Application pending·0 cites
- 2641US2007284634A1Semiconductor device and method of manufacturing the sameELPIDA MEMORY INC·Filed 2007·Application pending·0 cites
- 2741US2006099826A1Method of forming an insulation film and semiconductor device having the insulation filmELPIDA MEMORY INC·Filed 2005·Application pending·0 cites
- 2840US2006166459A1Semiconductor apparatus and method of producing the sameELPIDA MEMORY INC·Filed 2006·Application pending·0 cites
- 2938US2005215026A1Method for producing semiconductor deviceELPIDA MEMORY INC·Filed 2005·Application pending·0 cites
- 3037US6214700B1Semiconductor device and method for producing sameNEC CORP·Filed 1999·Granted Apr 10, 2001·6 cites·9 claims
- 3137US2005227452A1Method for producing semiconductor deviceELPIDA MEMORY INC·Filed 2005·Application pending·0 cites
- 3235US2007099364A1Method for manufacturing a semiconductor device having a polymetal gate electrodeOHASHI TAKUO·Filed 2006·Application pending·0 cites
- 3331US2002127819A1Semiconductor device and fabrication process thereforFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →