Inventor · disambiguated record
Takashi Ohshima
Also filed as: OHSHIMA TAKASHI
66 granted patents·12 pending applications·584 citations·filing 1984–2022
98Inventor score
Files withHITACHI HIGH TECH CORP33HITACHI LTD7OHSHIMA TAKASHI4SENQCIA CORP4TAKASAGO PERFUMERY CO LTD4
Top patents by PatentIndex Score
78 records- 0198US7582885B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 1, 2009·61 cites·5 claims
- 0297US5241197ATransistor provided with strained germanium layerHITACHI LTD·Filed 1991·Granted Aug 31, 1993·188 cites·22 claims
- 0395US7615765B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Nov 10, 2009·23 cites·20 claims
- 0495US7339167B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Mar 4, 2008·29 cites·20 claims
- 0594US8115184B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2008·Granted Feb 14, 2012·20 cites·15 claims
- 0692US7781743B2Charged particle beam system and method for evacuation of the systemHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 24, 2010·16 cites·17 claims
- 0790US9029766B2Scanning electron microscopeMORISHITA HIDEO·Filed 2012·Granted May 12, 2015·15 cites·14 claims
- 0889US9508527B2Sample base, charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 29, 2016·8 cites·17 claims
- 0987US8629395B2Charged particle beam apparatusMORISHITA HIDEO·Filed 2011·Granted Jan 14, 2014·10 cites·17 claims
- 1086US8450699B2Electron beam device and electron beam application device using the sameOHSHIMA TAKASHI·Filed 2009·Granted May 28, 2013·10 cites·14 claims
- 1186US7755046B2Transmission electron microscopeHITACHI LTD·Filed 2008·Granted Jul 13, 2010·9 cites·8 claims
- 1285US10707046B2Electron source and electron beam device using the sameHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 7, 2020·3 cites·13 claims
- 1385US9570268B2Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gunHITACHI HIGH TECH CORP·Filed 2014·Granted Feb 14, 2017·6 cites·15 claims
- 1485US8426835B2Charged particle radiation deviceKASUYA KEIGO·Filed 2010·Granted Apr 23, 2013·8 cites·20 claims
- 1584US11062892B2Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometerHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 13, 2021·3 cites·10 claims
- 1684US5616926ASchottky emission cathode and a method of stabilizing the sameHITACHI LTD·Filed 1995·Granted Apr 1, 1997·43 cites·50 claims
- 1783US11251011B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 15, 2022·3 cites·8 claims
- 1883US10241062B2Charged particle beam device, sample observation method, sample platform, observation system, and light emitting memberHITACHI HIGH TECH CORP·Filed 2014·Granted Mar 26, 2019·4 cites·23 claims
- 1982US9837243B2Ion pump and charged particle beam device using the sameHITACHI LTD·Filed 2016·Granted Dec 5, 2017·3 cites·13 claims
- 2080US8217363B2Scanning electron microscopeHATANO MICHIO·Filed 2008·Granted Jul 10, 2012·6 cites·5 claims
- 2179US10522319B2Electron beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 31, 2019·2 cites·15 claims
- 2278US10134564B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 20, 2018·3 cites·15 claims
- 2378US7759652B2Electron lens and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 20, 2010·4 cites·19 claims
- 2475US9812288B2Sample holder with light emitting and transferring elements for a charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 7, 2017·2 cites·18 claims
- 2574US8530865B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2012·Granted Sep 10, 2013·2 cites·13 claims
- 2673US7238939B2Small electron gunHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 3, 2007·7 cites·18 claims
- 2772US9208994B2Electron beam apparatus for visualizing a displacement of an electric fieldOHSHIMA TAKASHI·Filed 2011·Granted Dec 8, 2015·3 cites·17 claims
- 2871US8866371B2Electric field discharge-type electron sourceHITACHI HIGH TECH CORP·Filed 2012·Granted Oct 21, 2014·2 cites·10 claims
- 2970US9355815B2Electron microscope and electron beam detectorHITACHI HIGH TECH CORP·Filed 2013·Granted May 31, 2016·2 cites·8 claims
- 3070US9278905B2Production method for compound comprising amino group and/or hydroxyl groupOHSHIMA TAKASHI·Filed 2013·Granted Mar 8, 2016·1 cites·14 claims
- 3170US8319193B2Charged particle beam apparatus, and method of controlling the sameKASUYA KEIGO·Filed 2009·Granted Nov 27, 2012·2 cites·11 claims
- 3268US10340117B2Ion beam device and sample observation methodHITACHI LTD·Filed 2014·Granted Jul 2, 2019·1 cites·6 claims
- 3367US9202667B2Charged particle radiation device with bandpass detectionHATANO MICHIO·Filed 2010·Granted Dec 1, 2015·2 cites·11 claims
- 3464US8772735B2Charged particle beam apparatus, and method of controlling the sameKASUYA KEIGO·Filed 2012·Granted Jul 8, 2014·1 cites·14 claims
- 3560US12290388B2Computed tomography (CT) imaging system, radiation imaging system, and method of acquiring CT imaging dataCANON MEDICAL SYSTEMS CORP·Filed 2022·Granted May 6, 2025·0 cites·20 claims
- 3660US8651513B2AirbagOKAMOTO MASAKAZU·Filed 2011·Granted Feb 18, 2014·2 cites·8 claims
- 3760US6833442B2Complex and method for producing epoxides by using the complexUNIV TOKYO·Filed 2002·Granted Dec 21, 2004·19 cites·6 claims
- 3859US8686380B2Charged particle beam apparatusKATAGIRI SOUICHI·Filed 2009·Granted Apr 1, 2014·1 cites·17 claims
- 3959US6888138B2Absorption current image apparatus in electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted May 3, 2005·3 cites·13 claims
- 4058US2007236143A1Small electron gunHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 4157US9593492B2Lid member and floor panel using the sameSENQCIA CORP·Filed 2013·Granted Mar 14, 2017·2 cites·5 claims
- 4257US8232712B2Small electron gunKATAGIRI SOICHI·Filed 2009·Granted Jul 31, 2012·0 cites·6 claims
- 4355US11185851B2Polymer-supported metalTAKASAGO PERFUMERY CO LTD·Filed 2017·Granted Nov 30, 2021·0 cites·2 claims
- 4455US9752330B2Base isolation floor structureSENQCIA CORP·Filed 2013·Granted Sep 5, 2017·3 cites·6 claims
- 4555US2025349493A1Electron microscope and image capturing method thereofHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 4654US12334297B2Electron gun and electron beam application deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 17, 2025·0 cites·14 claims
- 4754US7888513B2Condensation reaction by metal catalystTAKASAGO PERFUMERY CO LTD·Filed 2006·Granted Feb 15, 2011·0 cites·9 claims
- 4853US8714585B2Knee airbagOKAMOTO MASAKAZU·Filed 2011·Granted May 6, 2014·1 cites·9 claims
- 4953US5811819AElectron beam source and its manufacturing method and electron beam source apparatus and electron beam apparatus using the sameHITACHI LTD·Filed 1995·Granted Sep 22, 1998·10 cites·37 claims
- 5053US2013190502A1Acylation reaction of hydroxyl groupTAKASAGO PERFUMERY CO LTD·Filed 2013·Application pending·0 cites
Showing the top 50 of 78 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →