Inventor · disambiguated record
Takamasa Okawa
Also filed as: OKAWA TAKAMASA
24 granted patents·2 pending applications·35 citations·filing 2012–2019
92Inventor score
Top patents by PatentIndex Score
26 records- 0188US9252358B2Semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2013·Granted Feb 2, 2016·7 cites·20 claims
- 0282US9281345B2Resistance change type memory device with three-dimensional structureTOSHIBA KK·Filed 2013·Granted Mar 8, 2016·4 cites·16 claims
- 0381US9831121B2Semiconductor memory device with contact plugs extending inside contact connection portionsTOSHIBA MEMORY CORP·Filed 2016·Granted Nov 28, 2017·4 cites·10 claims
- 0477US10692876B2Semiconductor device and method of manufacturing the sameTOSHIBA MEMORY CORP·Filed 2019·Granted Jun 23, 2020·2 cites·14 claims
- 0571US10629612B2Memory deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Apr 21, 2020·2 cites·19 claims
- 0668US9214228B1Semiconductor memory device and method of forming thereofTOSHIBA KK·Filed 2013·Granted Dec 15, 2015·3 cites·18 claims
- 0766US9190147B2Resistance changing memory with a first driver closer than a second driverTOSHIBA KK·Filed 2013·Granted Nov 17, 2015·3 cites·19 claims
- 0862US9379165B2Semiconductor memory deviceTOSHIBA KK·Filed 2014·Granted Jun 28, 2016·1 cites·20 claims
- 0962US8665634B2Semiconductor memory deviceMINEMURA YOICHI·Filed 2012·Granted Mar 4, 2014·2 cites·19 claims
- 1061US9202564B2Semiconductor memory device and method of controlling data thereofTOSHIBA KK·Filed 2013·Granted Dec 1, 2015·2 cites·20 claims
- 1156US9437296B2Three-dimensional resistive memory device with adjustable voltage biasingTOSHIBA KK·Filed 2014·Granted Sep 6, 2016·1 cites·5 claims
- 1254US9286978B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2014·Granted Mar 15, 2016·1 cites·17 claims
- 1354US9224469B2Semiconductor memory device and memory systemTOSHIBA KK·Filed 2014·Granted Dec 29, 2015·1 cites·16 claims
- 1454US9042158B2Nonvolatile semiconductor memory device with protective resistance filmTOSHIBA KK·Filed 2013·Granted May 26, 2015·1 cites·16 claims
- 1552US8804402B2Nonvolatile semiconductor memory deviceMINEMURA YOICHI·Filed 2012·Granted Aug 12, 2014·1 cites·20 claims
- 1648US10115731B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Oct 30, 2018·0 cites·15 claims
- 1743US9368555B2Semiconductor memory deviceTOSHIBA KK·Filed 2014·Granted Jun 14, 2016·0 cites·16 claims
- 1842US9780147B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Oct 3, 2017·0 cites·8 claims
- 1940US9142290B2Nonvolatile semiconductor device and method for driving sameTOSHIBA KK·Filed 2013·Granted Sep 22, 2015·0 cites·14 claims
- 2039US9679911B2Semiconductor memory device and production method thereofTOSHIBA KK·Filed 2015·Granted Jun 13, 2017·0 cites·5 claims
- 2139US9311995B2Semiconductor memory device and control method thereofTOSHIBA KK·Filed 2014·Granted Apr 12, 2016·0 cites·10 claims
- 2238US8908416B2Semiconductor memory deviceKabushishi Kaisha Toshiba·Filed 2014·Granted Dec 9, 2014·0 cites·22 claims
- 2337US8958230B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Feb 17, 2015·0 cites·14 claims
- 2437US2014355326A1Non-volatile memory deviceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2534US2016276353A1Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
- 2633US9117516B2Resistance change memoryTOSHIBA KK·Filed 2013·Granted Aug 25, 2015·0 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →