Inventor · disambiguated record
Takaaki Okumura
Also filed as: OKUMURA TAKAAKI
7 granted patents·1 pending application·191 citations·filing 1991–2015
85Inventor score
Files withFUJITSU LTD2FUJITSU SEMICONDUCTOR LTD2KAWASAKI HEAVY IND LTD2OKUMURA TAKAAKI1SOCIONEXT INC1
Top patents by PatentIndex Score
8 records- 0184US5475613AUltrasonic defect testing method and apparatusKAWASAKI HEAVY IND LTD·Filed 1992·Granted Dec 12, 1995·86 cites·31 claims
- 0276US5182775AMethod of processing radiographic image data for detecting a welding defectKAWASAKI HEAVY IND LTD·Filed 1991·Granted Jan 26, 1993·69 cites·9 claims
- 0367US7921395B2Method for laying out decoupling cells and apparatus for laying out decoupling cellsFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Apr 5, 2011·4 cites·16 claims
- 0458US8224601B2Semiconductor device and method of estimating capacitance valueOKUMURA TAKAAKI·Filed 2008·Granted Jul 17, 2012·3 cites·11 claims
- 0547US5650947ALogic simulation method and logic simulatorFUJITSU LTD·Filed 1995·Granted Jul 22, 1997·22 cites·15 claims
- 0644US9473254B2Apparatus and design methodSOCIONEXT INC·Filed 2015·Granted Oct 18, 2016·0 cites·12 claims
- 0734US2015205898A1Design method and design apparatusFUJITSU SEMICONDUCTOR LTD·Filed 2015·Application pending·0 cites
- 0833US6032277AMethod and apparatus for logic testing an integrated circuitFUJITSU LTD·Filed 1998·Granted Feb 29, 2000·7 cites·21 claims
Join the waitlist — get patent alerts
Get an alert when Takaaki Okumura files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →