Inventor · disambiguated record
Takako Onishi
Also filed as: ONISHI TAKAKO
9 granted patents·6 pending applications·37 citations·filing 1985–2022
82Inventor score
Top patents by PatentIndex Score
15 records- 0191US10054432B2X-ray inspection apparatus and control methodOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Aug 21, 2018·6 cites·15 claims
- 0279US7822261B2Board inspecting apparatus, its parameter setting method and parameter setting apparatusOMRON TATEISI ELECTRONICS CO·Filed 2006·Granted Oct 26, 2010·7 cites·9 claims
- 0378USD290969SRemote controller for a printerMINOLTA CAMERA KK·Filed 1985·Granted Jul 21, 1987·20 cites·1 claims
- 0468US7715616B2PC board inspecting method and apparatus and inspection logic setting method and apparatusOMRON TATEISI ELECTRONICS CO·Filed 2006·Granted May 11, 2010·4 cites·24 claims
- 0558US12012266B2Ejection capSHISEIDO CO LTD·Filed 2020·Granted Jun 18, 2024·0 cites·3 claims
- 0654US2024183792A1Inspection system, inspection management device, inspecting method, and programOMRON TATEISI ELECTRONICS CO·Filed 2022·Application pending·0 cites
- 0753US10876977B2Inspection management system, inspection management apparatuses, and inspection management methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Dec 29, 2020·0 cites·20 claims
- 0847US2022073360A1Zeolite and Manufacturing Method ThereofUNIV TOKYO·Filed 2019·Application pending·0 cites
- 0946US2024062401A1Measurement system, inspection system, measurement device, measurement method, inspection method, and programOMRON TATEISI ELECTRONICS CO·Filed 2021·Application pending·0 cites
- 1046US2024224485A1Inspection system, inspection management device, inspection program creating method, and programOMRON TATEISI ELECTRONICS CO·Filed 2022·Application pending·0 cites
- 1145US11154001B2Inspection management system, inspection management apparatuses, and inspection management methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Oct 19, 2021·0 cites·12 claims
- 1244US2006153439A1PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatusOMRON TATEISI ELECTRONICS CO·Filed 2006·Application pending·0 cites
- 1343US10605748B2X-ray inspection apparatus and X-ray inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Mar 31, 2020·0 cites·7 claims
- 1443US10545101B2Inspection apparatusOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Jan 28, 2020·0 cites·11 claims
- 1543US2016267443A1Data structure, library creation device, electronic device analysis device, and library provision systemOMRON TATEISI ELECTRONICS CO·Filed 2014·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Takako Onishi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →