Inventor · disambiguated record
Takayoshi Oosakaya
Also filed as: OOSAKAYA TAKAYOSHI
3 granted patents·41 citations·filing 1989–1993
71Inventor score
Technology areasG03F
Files withHITACHI LTD3
Top patents by PatentIndex Score
3 records- 0169US5094539AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1989·Granted Mar 10, 1992·22 cites·18 claims
- 0253US5432608AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1993·Granted Jul 11, 1995·11 cites·51 claims
- 0346US5260771AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1991·Granted Nov 9, 1993·8 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →