Inventor · disambiguated record
Takahiko Oshige
Also filed as: OSHIGE TAKAHIKO
10 granted patents·338 citations·filing 1991–2018
90Inventor score
Top patents by PatentIndex Score
10 records- 0192US5835220AMethod and apparatus for detecting surface flawsNIPPON KOKAN KK·Filed 1995·Granted Nov 10, 1998·150 cites·7 claims
- 0291US7248366B2Method for marking defect and device thereforNIPPON KOKAN KK·Filed 2001·Granted Jul 24, 2007·20 cites·37 claims
- 0385US5335066AMeasuring method for ellipsometric parameter and ellipsometerNIPPON KOKAN KK·Filed 1993·Granted Aug 2, 1994·69 cites·10 claims
- 0483US7423744B2Method for marking defect and device thereforNIPPON KOKAN KK·Filed 2006·Granted Sep 9, 2008·7 cites·16 claims
- 0581US5311285AMeasuring method for ellipsometric parameter and ellipsometerNIPPON KOKAN KK·Filed 1991·Granted May 10, 1994·46 cites·7 claims
- 0678US5438415AEllipsometer and method of controlling coating thickness therewithNIPPON KOKAN KK·Filed 1992·Granted Aug 1, 1995·44 cites·8 claims
- 0771US7599052B2Method for marking defect and device thereforNIPPON KOKAN KK·Filed 2008·Granted Oct 6, 2009·2 cites·10 claims
- 0849US9594191B2Solar reflector plateJFE STEEL CORP·Filed 2013·Granted Mar 14, 2017·0 cites·19 claims
- 0947US9234680B2Solar light reflecting plate and light collecting/heat collecting deviceSASHI KAZUMICHI·Filed 2012·Granted Jan 12, 2016·0 cites·9 claims
- 1042US10859507B2Surface defect inspection method and surface defect inspection apparatusJFE STEEL CORP·Filed 2018·Granted Dec 8, 2020·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →