Inventor · disambiguated record
Tadashi Oshimi
Also filed as: OSHIMI TADASHI
5 granted patents·85 citations·filing 1993–2016
79Inventor score
Top patents by PatentIndex Score
5 records- 0173US5428300AMethod and apparatus for testing TFT-LCDTELENIX CO LTD·Filed 1993·Granted Jun 27, 1995·48 cites·16 claims
- 0271US10126752B2Work machine, system, method, program, and recording medium recording program for generating travel route of work machine, for determining availability of entry to travel route, and for automatically selecting travel route, and travel control system of work machineMAMIYA OP CO LTD·Filed 2016·Granted Nov 13, 2018·2 cites·22 claims
- 0369US10120382B2Work machine, system, method, and recording medium recording computer program for determining availability of entry to travel route, and travel control system of work machineMAMIYA OP CO LTD·Filed 2016·Granted Nov 6, 2018·2 cites·19 claims
- 0464US5539326AMethod for testing the wiring or state of a liquid crystal display and thin film transistorTOHKEN IND CO LTD·Filed 1994·Granted Jul 23, 1996·33 cites·10 claims
- 0550US10114377B2Work machine, system, method, and recording medium recording computer program for generating travel route of work machine, and travel control system of work machineMAMIYA OP CO LTD·Filed 2016·Granted Oct 30, 2018·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →