Inventor · disambiguated record
Takanori Shimura
Also filed as: SHIMURA TAKANORI
25 granted patents·3 pending applications·697 citations·filing 1985–2011
97Inventor score
Top patents by PatentIndex Score
28 records- 0196US6337593B1Semiconductor integrated circuitHITACHI LTD·Filed 2000·Granted Jan 8, 2002·78 cites·28 claims
- 0292US7598796B2Semiconductor integrated circuit including charging pumpRENESAS TECH CORP·Filed 2007·Granted Oct 6, 2009·18 cites·5 claims
- 0391US5544050ASign language learning system and methodHITACHI LTD·Filed 1993·Granted Aug 6, 1996·152 cites·13 claims
- 0490US6483374B1Semiconductor integrated circuitHITACHI LTD·Filed 1998·Granted Nov 19, 2002·48 cites·7 claims
- 0588US5887069ASign recognition apparatus and method and sign translation system using sameHITACHI LTD·Filed 1995·Granted Mar 23, 1999·151 cites·30 claims
- 0687US7477983B2Exhaust gas diagnosis system and vehicle control systemHITACHI LTD·Filed 2007·Granted Jan 13, 2009·11 cites·9 claims
- 0785US7593752B2Sensor node, base station, and sensor network systemHITACHI LTD·Filed 2007·Granted Sep 22, 2009·12 cites·9 claims
- 0885US7512418B2Sensor node, base station, and sensor network systemHITACHI LTD·Filed 2005·Granted Mar 31, 2009·11 cites·10 claims
- 0985US7257481B2Exhaust gas diagnosis system and vehicle control systemHITACHI LTD·Filed 2005·Granted Aug 14, 2007·13 cites·11 claims
- 1083US7958379B2Substrate bias switching unit for a low power processorRENESAS ELECTRONICS CORP·Filed 2008·Granted Jun 7, 2011·9 cites·7 claims
- 1182US8364988B2Substrate bias switching unit for a low power processorRENESAS ELECTRONICS CORP·Filed 2011·Granted Jan 29, 2013·5 cites·10 claims
- 1281US7321252B2Semiconductor integrated circuitRENESAS TECH CORP·Filed 2006·Granted Jan 22, 2008·7 cites·7 claims
- 1379US6715090B1Processor for controlling substrate biases in accordance to the operation modes of the processorRENESAS TECH CORP·Filed 1997·Granted Mar 30, 2004·67 cites·9 claims
- 1477US7046075B2Semiconductor integrated circuitRENESAS TECH CORP·Filed 2005·Granted May 16, 2006·5 cites·18 claims
- 1573US6987415B2Semiconductor integrated circuitRENESAS TECH CORP·Filed 2004·Granted Jan 17, 2006·9 cites·6 claims
- 1670US7475261B2Substrate bias switching unit for a low power processorRENESAS TECH CORP·Filed 2004·Granted Jan 6, 2009·11 cites·10 claims
- 1770US6600360B2Semiconductor integrated circuitHITACHI LTD·Filed 2002·Granted Jul 29, 2003·10 cites·16 claims
- 1861US7617021B2Radio communication system for controlling a vehicleHITACHI LTD·Filed 2009·Granted Nov 10, 2009·1 cites·17 claims
- 1958US6707334B2Semiconductor integrated circuitRENESAS TECH CORP·Filed 2003·Granted Mar 16, 2004·4 cites·6 claims
- 2058US4674037AData processing system with an enhanced communication control systemHITACHI LTD·Filed 1985·Granted Jun 16, 1987·26 cites·13 claims
- 2157US7894947B2Radio communication system for controlling a vehicleHITACHI LTD·Filed 2009·Granted Feb 22, 2011·0 cites·17 claims
- 2255US7626498B2Sensor nodeHITACHI LTD·Filed 2005·Granted Dec 1, 2009·2 cites·22 claims
- 2354US5138669ARange-conditional character string retrieving method and systemHITACHI LTD·Filed 1991·Granted Aug 11, 1992·29 cites·34 claims
- 2451US2007191719A1Controller for senor node, measurement method for biometric information and its softwareHITACHI LTD·Filed 2007·Application pending·0 cites
- 2550US7496432B2Radio communications system for controlling a vehicleHITACHI LTD·Filed 2005·Granted Feb 24, 2009·0 cites·17 claims
- 2650US4773002AMicroprogram controller in which instruction following conditional branch instruction is selectively converted to a NOP instructionHITACHI LTD·Filed 1986·Granted Sep 20, 1988·18 cites·4 claims
- 2749US2006229520A1Controller for sensor node, measurement method for biometric information and its softwareYAMASHITA SHUNZO·Filed 2005·Application pending·0 cites
- 2841US2006076934A1Control circuit for charging/discharging of secondary cell and a sensor nodeOGATA YUJI·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →