Inventor · disambiguated record
Takeshi Soeda
Also filed as: SOEDA TAKESHI
9 granted patents·14 pending applications·19 citations·filing 2003–2025
81Inventor score
Top patents by PatentIndex Score
23 records- 0195US11650579B2Information processing device, production facility monitoring method, and computer-readable recording medium recording production facility monitoring programFUJITSU LTD·Filed 2020·Granted May 16, 2023·4 cites·11 claims
- 0272US7342226B2Stress measuring method and systemFUJITSU LTD·Filed 2006·Granted Mar 11, 2008·4 cites·14 claims
- 0365US7084400B2Lattice strain measuring system and methodFUJITSU LTD·Filed 2004·Granted Aug 1, 2006·7 cites·16 claims
- 0462US11054460B2Soft error inspection method, soft error inspection apparatus, and soft error inspection systemFUJITSU LTD·Filed 2019·Granted Jul 6, 2021·0 cites·9 claims
- 0560US2025322284A1Non-transitory computer-readable recording medium, calculation method and information processing deviceFUJITSU LTD·Filed 2025·Application pending·0 cites
- 0659US6822234B2Method for measuring localized region lattice strain by means of convergent beam electron diffraction, and measurement device thereofFUJITSU LTD·Filed 2003·Granted Nov 23, 2004·4 cites·9 claims
- 0758US2025124349A1Computer-readable recording medium storing arithmetic program, arithmetic method, and information processing deviceFUJITSU LTD·Filed 2024·Application pending·0 cites
- 0858US2022350318A1Information processing apparatus, search method, and storage mediumFUJITSU LTD·Filed 2022·Application pending·0 cites
- 0957US2023041877A1Material evaluation device, material evaluation method, and storage mediumFUJITSU LTD·Filed 2022·Application pending·0 cites
- 1057US2023035149A1Information processing device, work plan specifying method, and storage mediumFUJITSU LTD·Filed 2022·Application pending·0 cites
- 1156US11199833B2Quality determination method, quality determination device, quality determination system and computer-readable non-transitory mediumFUJITSU LTD·Filed 2019·Granted Dec 14, 2021·0 cites·14 claims
- 1252US2023409923A1Computer-readable recording medium storing arithmetic program, arithmetic method, and information processing deviceFUJITSU LTD·Filed 2023·Application pending·0 cites
- 1350US2021026339A1Information processing device, determination rule acquisition method, and computer-readable recording medium recording determination rule acquisition programFUJITSU LTD·Filed 2020·Application pending·0 cites
- 1449US2020348131A1Method of diagnosing pipe, device of diagnosing pipe, and system of diagnosing pipeFUJITSU LTD·Filed 2020·Application pending·0 cites
- 1546US2020074026A1Thermal analysis device and thermal analysis methodFUJITSU LTD·Filed 2019·Application pending·0 cites
- 1645US8299430B2Electron microscope and observation methodSOEDA TAKESHI·Filed 2009·Granted Oct 30, 2012·0 cites·8 claims
- 1745US2024111823A1Storage medium, flow generation method, and information processing deviceFUJITSU LTD·Filed 2023·Application pending·0 cites
- 1844US2022215137A1Information processing apparatus, information processing method, and computer-readable recording medium storing information processing programFUJITSU LTD·Filed 2021·Application pending·0 cites
- 1944US2022129605A1Optimization device, optimization method, and computer-readable recording medium storing optimization programFUJITSU LTD·Filed 2021·Application pending·0 cites
- 2044US2022180210A1Optimization apparatus, optimization method, and computer-readable recording medium storing optimization programFUJITSU LTD·Filed 2021·Application pending·0 cites
- 2138US8780193B2Physical properties measuring method and apparatusYAMAZAKI TAKASHI·Filed 2011·Granted Jul 15, 2014·0 cites·8 claims
- 2237US2016327498A1Material evaluation device and methodFUJITSU LTD·Filed 2016·Application pending·0 cites
- 2336US7571653B2Stress measuring method and systemFUJITSU LTD·Filed 2006·Granted Aug 11, 2009·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →