Inventor · disambiguated record
Takeshi Sunaoshi
Also filed as: SUNAOSHI TAKESHI
6 granted patents·1 pending application·14 citations·filing 2005–2016
76Inventor score
Top patents by PatentIndex Score
7 records- 0179US7732791B2Semiconductor testing method and semiconductor testerHITACHI HIGH TECH CORP·Filed 2007·Granted Jun 8, 2010·5 cites·19 claims
- 0270US8040146B2Inspection apparatus having a heating mechanism for performing sample temperature regulationHITACHI HIGH TECH CORP·Filed 2010·Granted Oct 18, 2011·2 cites·20 claims
- 0370US7663390B2Inspection apparatus and methodHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·5 cites·13 claims
- 0469US10204761B2Charged particle beam device, electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Feb 12, 2019·2 cites·16 claims
- 0548US8067752B2Semiconductor testing method and semiconductor testerANDO TOHRU·Filed 2010·Granted Nov 29, 2011·0 cites·10 claims
- 0637US2007161494A1Non-oxide ceramic having oxide layer on the surface thereof, method for production thereof and use thereofCIRCLE PROMOTION SCIENCE & ENG·Filed 2005·Application pending·0 cites
- 0733US10784074B2Charged particle beam apparatus and control method thereofHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 22, 2020·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →