Inventor · disambiguated record
Takeyoshi Taguchi
Also filed as: TAGUCHI TAKEYOSHI
7 granted patents·1 pending application·112 citations·filing 2000–2015
84Inventor score
Files withRIGAKU DENKI CO LTD8
Top patents by PatentIndex Score
8 records- 0186US6456688B1X-ray spectrometer and apparatus for XAFS measurementsRIGAKU DENKI CO LTD·Filed 2000·Granted Sep 24, 2002·59 cites·7 claims
- 0284US7535992B2X-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2006·Granted May 19, 2009·10 cites·5 claims
- 0378US6529578B1X-ray condenser and x-ray apparatusRIGAKU DENKI CO LTD·Filed 2000·Granted Mar 4, 2003·30 cites·14 claims
- 0464US7145983B2X-ray analysis apparatusRIGAKU DENKI CO LTD·Filed 2004·Granted Dec 5, 2006·10 cites·12 claims
- 0563US10551510B2Data processing apparatus, method of obtaining characteristic of each pixel and method of data processing, and programRIGAKU DENKI CO LTD·Filed 2015·Granted Feb 4, 2020·1 cites·10 claims
- 0648US6738453B2Hot cathode of X-ray tubeRIGAKU DENKI CO LTD·Filed 2002·Granted May 18, 2004·2 cites·11 claims
- 0746US7209541B2X-ray analysis apparatusRIGAKU DENKI CO LTD·Filed 2004·Granted Apr 24, 2007·0 cites·11 claims
- 0841US2005190276A1Method for CCD sensor control, CCD sensor system and X-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →