Inventor · disambiguated record
Takenori Takahashi
Also filed as: TAKAHASHI TAKENORI
5 granted patents·1 pending application·1 citations·filing 2016–2024
60Inventor score
Top patents by PatentIndex Score
6 records- 0162US9869715B2Semiconductor wafer inspection apparatus and semiconductor wafer inspection methodTOKYO SEIMITSU CO LTD·Filed 2016·Granted Jan 16, 2018·1 cites·10 claims
- 0260US12293873B2Input deviceALPS ALPINE CO LTD·Filed 2024·Granted May 6, 2025·0 cites·6 claims
- 0356US12387966B2Wafer chuck, temperature control system, and temperature control methodTOKYO SEIMITSU CO LTD·Filed 2024·Granted Aug 12, 2025·0 cites·11 claims
- 0452US12294273B2Vibration generating deviceALPS ALPINE CO LTD·Filed 2023·Granted May 6, 2025·0 cites·4 claims
- 0552US2024274492A1Temperature adjustment deviceKELK LTD·Filed 2024·Application pending·0 cites
- 0648US12444626B2Temperature control device for semiconductor wafer and temperature control method for semiconductor waferKELK LTD·Filed 2022·Granted Oct 14, 2025·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →