Inventor · disambiguated record
Takeo Tatematsu
Also filed as: MIYASAKA KIYOSHI · TATEMATSU TAKEO
12 granted patents·281 citations·filing 1978–1991
92Inventor score
Files withFUJITSU LTD12
Top patents by PatentIndex Score
12 records- 0185US4464750ASemiconductor memory deviceFUJITSU LTD·Filed 1981·Granted Aug 7, 1984·42 cites·8 claims
- 0282US4473895ASemiconductor memory deviceFUJITSU LTD·Filed 1980·Granted Sep 25, 1984·36 cites·14 claims
- 0381US4821238ASemiconductor memory device having test pattern generating circuitFUJITSU LTD·Filed 1986·Granted Apr 11, 1989·42 cites·10 claims
- 0480US4592025AInformation storing circuit using blown and unblown fusesFUJITSU LTD·Filed 1984·Granted May 27, 1986·27 cites·19 claims
- 0575US4156939AIntegrated semiconductor memory deviceFUJITSU LTD·Filed 1978·Granted May 29, 1979·19 cites·17 claims
- 0672US4752914ASemiconductor integrated circuit with redundant circuit replacementFUJITSU LTD·Filed 1985·Granted Jun 21, 1988·31 cites·11 claims
- 0771US4982369ASelf-refresh semiconductor memory device responsive to a refresh request signalFUJITSU LTD·Filed 1989·Granted Jan 1, 1991·28 cites·9 claims
- 0861US4802127AOutput buffer circuit for a semiconductor memory deviceFUJITSU LTD·Filed 1988·Granted Jan 31, 1989·18 cites·3 claims
- 0959US4707806ASemiconductor integrated circuit device having fuse-type information storing circuitFUJITSU LTD·Filed 1985·Granted Nov 17, 1987·24 cites·15 claims
- 1039US5111073AWafer-scale semiconductor device having fail-safe circuitFUJITSU LTD·Filed 1990·Granted May 5, 1992·7 cites·20 claims
- 1134US5138419AWafer scale integration device with dummy chips and relay padsFUJITSU LTD·Filed 1991·Granted Aug 11, 1992·6 cites·17 claims
- 1229US5140555ASemiconductor integrated device having uniform noise between a pair of undecided voltage portionsFUJITSU LTD·Filed 1989·Granted Aug 18, 1992·1 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →