Inventor · disambiguated record
Takeshi Tomita
Also filed as: TOMITA TAKESHI
15 granted patents·215 citations·filing 1982–2021
93Inventor score
Top patents by PatentIndex Score
15 records- 0185US6759656B2Electron microscope equipped with electron biprismJEOL LTD·Filed 2001·Granted Jul 6, 2004·24 cites·4 claims
- 0285US5378450AProcess for producing hydrogen peroxideMITSUBISHI GAS CHEMICAL CO·Filed 1994·Granted Jan 3, 1995·42 cites·11 claims
- 0381US5399334AProcess for producing hydrogen peroxideMITSUBISHI GAS CHEMICAL CO·Filed 1994·Granted Mar 21, 1995·36 cites·10 claims
- 0476US6132818AMethod of marking with laser beamOMRON TATEISI ELECTRONICS CO·Filed 1997·Granted Oct 17, 2000·31 cites·2 claims
- 0575US7586304B2Stator position measuring method and measuring deviceAISIN AW CO·Filed 2006·Granted Sep 8, 2009·7 cites·23 claims
- 0672US7508151B2Stator position adjustment method and deviceAISIN AW CO·Filed 2006·Granted Mar 24, 2009·6 cites·24 claims
- 0772US4814716AApparatus for producing and accelerating an electron beamJEOL LTD·Filed 1987·Granted Mar 21, 1989·18 cites·4 claims
- 0866US12463007B2Electron microscope analysis systemRIKEN·Filed 2021·Granted Nov 4, 2025·0 cites·5 claims
- 0966US7866027B2Motor driving device manufacturing methodAISIN AW CO·Filed 2006·Granted Jan 11, 2011·4 cites·20 claims
- 1064US4633085ATransmission-type electron microscopeJEOL LTD·Filed 1985·Granted Dec 30, 1986·13 cites·3 claims
- 1164US4626689AElectron beam focusing system for electron microscopeJEOL LTD·Filed 1985·Granted Dec 2, 1986·14 cites·7 claims
- 1258US8158940B2Magnetic domain imaging systemTOMITA TAKESHI·Filed 2010·Granted Apr 17, 2012·1 cites·7 claims
- 1352US5811806AElectron-beam biprismJEOL LTD·Filed 1996·Granted Sep 22, 1998·11 cites·6 claims
- 1441US4459275AProcess for production of sulfur from SO2 -containing gasSUMITOMO HEAVY INDUSTRIES·Filed 1982·Granted Jul 10, 1984·6 cites·10 claims
- 1535US5763889AElectron beam-generating apparatusJEOL LTD·Filed 1997·Granted Jun 9, 1998·2 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →