Inventor · disambiguated record
Tamaki Toumiya
Also filed as: TOUMIYA TAMAKI
3 granted patents·75 citations·filing 1999–2000
74Inventor score
Top patents by PatentIndex Score
3 records- 0177US6751767B1Test pattern compression method, apparatus, system and storage mediumNEC ELECTRONICS CORP·Filed 2000·Granted Jun 15, 2004·35 cites·23 claims
- 0256US6334199B1Method of generating test patterns for a logic circuit, a system performing the method, and a computer readable medium instructing the system to perform the methodNEC CORP·Filed 1999·Granted Dec 25, 2001·22 cites·27 claims
- 0350US6425104B1Method and system for test pattern generation and a computer readable medium instructing the system to perform the methodNEC CORP·Filed 1999·Granted Jul 23, 2002·18 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →