Inventor · disambiguated record
Takeshi Ueki
Also filed as: UEKI TAKESHI
9 granted patents·5 pending applications·37 citations·filing 2003–2019
84Inventor score
Top patents by PatentIndex Score
14 records- 0185US7682135B2Variable displacement pumpSHOWA CORP·Filed 2006·Granted Mar 23, 2010·10 cites·6 claims
- 0283US7931450B2Variable displacement pumpSHOWA CORP·Filed 2007·Granted Apr 26, 2011·9 cites·8 claims
- 0376US10273982B2Pump device and hydraulic actuatorSHOWA CORP·Filed 2014·Granted Apr 30, 2019·3 cites·12 claims
- 0467US9726202B2Pump device and hydraulic actuatorSHOWA CORP·Filed 2014·Granted Aug 8, 2017·2 cites·8 claims
- 0565US7546895B2Variable displacement pumpSHOWA CORP·Filed 2007·Granted Jun 16, 2009·3 cites·12 claims
- 0659US10777293B2Semiconductor device, memory test method for semiconductor device, and test pattern generation programRENESAS ELECTRONICS CORP·Filed 2019·Granted Sep 15, 2020·1 cites·16 claims
- 0755US6953054B2Relief valveSHOWA CORP·Filed 2003·Granted Oct 11, 2005·9 cites·15 claims
- 0854US2018259829A1Shutter device and image-capturing apparatusNIKON CORP·Filed 2018·Application pending·0 cites
- 0951US9995989B2Shutter device and image-capturing apparatusNIKON CORP·Filed 2015·Granted Jun 12, 2018·0 cites·6 claims
- 1049US2008315457A1Joint in Fluid Device and Method of ManufactureSHOWA CORP·Filed 2007·Application pending·0 cites
- 1145US9162742B2Trim and tilt apparatus for marine vessel propulsion machineSHOWA CORP·Filed 2013·Granted Oct 20, 2015·0 cites·12 claims
- 1245US2009031267A1Layout correcting method for semiconductor integrated circuit and layout correcting device for semiconductor integrated circuitNEC ELECTRONICS CORP·Filed 2008·Application pending·0 cites
- 1336US2004057452A1Method and apparatus for transmitting information via serial busPIONEER CORP·Filed 2003·Application pending·0 cites
- 1436US2017351163A1Shutter device and image-capturing apparatusNIPPON KOGAKU KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →