Inventor · disambiguated record

Takeshi Wakita

Also filed as: WAKITA TAKESHI

2 granted patents·57 citations·filing 1989–2006

60Inventor score

Technology areasG01N G11B

Files withFUJI PHOTO FILM CO LTD1 FUJIFILM CORP1

Top patents by PatentIndex Score

2 records

0189US4954723ADisk surface inspection method and apparatus thereforFUJI PHOTO FILM CO LTD·Filed 1989·Granted Sep 4, 1990·55 cites·4 claims
0266US7408633B2Apparatus and method for inspecting film defectFUJIFILM CORP·Filed 2006·Granted Aug 5, 2008·2 cites·8 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →