Inventor · disambiguated record
Tatsuhiro Watanabe
Also filed as: WATANABE TATSUHIRO
4 granted patents·22 citations·filing 1992–2018
68Inventor score
Top patents by PatentIndex Score
4 records- 0185US7200059B2Semiconductor memory and burn-in test method of semiconductor memoryFUJITSU LTD·Filed 2005·Granted Apr 3, 2007·19 cites·10 claims
- 0275US10861660B2Safety switchIDEC CORP·Filed 2018·Granted Dec 8, 2020·2 cites·14 claims
- 0366US11087933B2Safety switchIDEC CORP·Filed 2018·Granted Aug 10, 2021·1 cites·8 claims
- 0424US5258639ASemiconductor memory device having multilayer wiring structureFUJITSU LTD·Filed 1992·Granted Nov 2, 1993·0 cites·9 claims
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