Inventor · disambiguated record
Takahisa Yamaguchi
Also filed as: YAMAGUCHI TAKAHISA
7 granted patents·3 pending applications·59 citations·filing 2000–2023
82Inventor score
Files withSUMITOMO ELECTRIC INDUSTRIES3KAWASAKI MICROELECTRONICS INC2KAWASE TSUTOMU2NIPPON ELECTRIC GLASS CO2ISHITORI ATSUSHI1
Top patents by PatentIndex Score
10 records- 0185US6565265B2Optical connector and method of assembling optical connectorSUMITOMO ELECTRIC INDUSTRIES·Filed 2001·Granted May 20, 2003·31 cites·9 claims
- 0279US9799929B2Apparatus, apparatus authentication management system and apparatus authentication methodKAWASE TSUTOMU·Filed 2013·Granted Oct 24, 2017·11 cites·15 claims
- 0370US6492189B1Method of arranging exposed areas including a limited number of test element group (TEG) regions on a semiconductor waferKAWASAKI MICROELECTRONICS INC·Filed 2000·Granted Dec 10, 2002·14 cites·19 claims
- 0467US11465317B2Method for manufacturing optical fiberSUMITOMO ELECTRIC INDUSTRIES·Filed 2019·Granted Oct 11, 2022·1 cites·3 claims
- 0562US2025382217A1Glass ceramic substrate, greensheet for glass ceramic substrate, and composite powder for glass ceramic substrateNIPPON ELECTRIC GLASS CO·Filed 2023·Application pending·0 cites
- 0651US11927798B2Optical fiberSUMITOMO ELECTRIC INDUSTRIES·Filed 2019·Granted Mar 12, 2024·0 cites·7 claims
- 0745US2023055612A1Connected substrate and method for manufacturing element substrate using sameNIPPON ELECTRIC GLASS CO·Filed 2021·Application pending·0 cites
- 0844US10356262B2Image processing apparatus and image processing methodISHITORI ATSUSHI·Filed 2017·Granted Jul 16, 2019·1 cites·29 claims
- 0944US6762433B2Semiconductor product wafer having vertically and horizontally arranged patterned areas including a limited number of test element group regionsKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted Jul 13, 2004·1 cites·4 claims
- 1044US2014111306A1Locking mechanism and locking systemKAWASE TSUTOMU·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →