Inventor · disambiguated record
Takahiro Yamakura
Also filed as: YAMAKURA TAKAHIRO
1 granted patent·1 pending application·1 citations·filing 2010–2013
16Inventor score
Top patents by PatentIndex Score
2 records- 0164US8339617B2Film thickness measuring device and film thickness measuring methodYAMADA TAKEO·Filed 2010·Granted Dec 25, 2012·1 cites·7 claims
- 0237US2013300598A1Apparatus for measuring width direction end position of strip, apparatus for measuring width direction central position of strip and microwave scattering plateNIRECO CORP·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →