Inventor · disambiguated record
Takashi Yamato
Also filed as: YAMATO TAKASHI
20 granted patents·1 pending application·270 citations·filing 1995–2019
94Inventor score
Top patents by PatentIndex Score
21 records- 0193US9028756B2Specimen analyzing method and specimen analyzing apparatusSYSMEX CORP·Filed 2013·Granted May 12, 2015·10 cites·17 claims
- 0292USD583481SCuvetteSYSMEX CORP·Filed 2007·Granted Dec 23, 2008·52 cites·1 claims
- 0392US5587129AApparatus for automatically analyzing specimenTOA MEDICAL ELECTRONICS·Filed 1995·Granted Dec 24, 1996·116 cites·13 claims
- 0489US8545760B2Specimen analyzing method and specimen analyzing apparatusYAMAMOTO NORIMASA·Filed 2007·Granted Oct 1, 2013·16 cites·12 claims
- 0589US8455256B2Sample processing apparatus and sample rack transporting methodYAMATO TAKASHI·Filed 2010·Granted Jun 4, 2013·10 cites·17 claims
- 0687US7787116B2CuvetteSYSMEX CORP·Filed 2008·Granted Aug 31, 2010·11 cites·15 claims
- 0785US8234941B2Specimen analyzing apparatus and specimen analyzing methodFUKUDA KAZUYA·Filed 2009·Granted Aug 7, 2012·11 cites·19 claims
- 0885US8064061B2Sample analyzer and sample analyzing methodYAMAMOTO NORIMASA·Filed 2007·Granted Nov 22, 2011·12 cites·21 claims
- 0984US7850921B2Dispenser, reagent dispenser and sample analyzerSYSMEX CORP·Filed 2007·Granted Dec 14, 2010·9 cites·24 claims
- 1082US9157924B2Analyzing apparatusYAMATO TAKASHI·Filed 2010·Granted Oct 13, 2015·5 cites·23 claims
- 1181US9316583B2Specimen analyzing method and specimen analyzing apparatusSYSMEX CORP·Filed 2015·Granted Apr 19, 2016·3 cites·20 claims
- 1275US9097689B2Throughput information generating apparatus of sample analyzer, sample analyzer, throughput information generating method of sample analyzer, and computer program productYAMATO TAKASHI·Filed 2011·Granted Aug 4, 2015·7 cites·6 claims
- 1373US9541567B2Sample analyzer with liquid aspirating unit and liquid surface detectorKURONO HIROSHI·Filed 2011·Granted Jan 10, 2017·2 cites·10 claims
- 1464US10261016B2Specimen analyzing method and specimen analyzing apparatusSYSMEX CORP·Filed 2016·Granted Apr 16, 2019·0 cites·23 claims
- 1563US9176155B2Sample processing apparatusYAMATO TAKASHI·Filed 2010·Granted Nov 3, 2015·2 cites·16 claims
- 1659US10908175B2Sample analyzer and liquid aspirating methodSYSMEX CORP·Filed 2016·Granted Feb 2, 2021·0 cites·13 claims
- 1754US8938857B2Slide hingeKATO ELECTRIC & MACHINARY CO·Filed 2013·Granted Jan 27, 2015·4 cites·9 claims
- 1853US9068956B2Specimen analyzing apparatus and specimen analyzing methodFUKUDA KAZUYA·Filed 2012·Granted Jun 30, 2015·0 cites·8 claims
- 1952US11422143B2Sample measuring apparatus and sample measuring methodSYSMEX CORP·Filed 2019·Granted Aug 23, 2022·0 cites·19 claims
- 2042US2012222773A1Analyzer and position confirming methodYAMATO TAKASHI·Filed 2012·Application pending·0 cites
- 2138US9395380B2Specimen processing apparatus that determines whether a moveable section was moved when a moving operation had been stoppedYAMATO TAKASHI·Filed 2010·Granted Jul 19, 2016·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →