Inventor · disambiguated record
Takashi Yanaka
Also filed as: YANAKA TAKASHI
3 granted patents·57 citations·filing 1979–1983
72Inventor score
Technology areasH01J
Top patents by PatentIndex Score
3 records- 0185US4596934AElectron beam apparatus with improved specimen holderINT PRECISION INC·Filed 1983·Granted Jun 24, 1986·37 cites·7 claims
- 0265US4316087AMethod of photographing electron microscope images on a single photographic plate and apparatus thereforINT PRECISION INC·Filed 1979·Granted Feb 16, 1982·12 cites·9 claims
- 0350US4458151AElectron microscope of a scanning typeKOIKE HIROTAMI·Filed 1982·Granted Jul 3, 1984·8 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →