Inventor · disambiguated record
Takaho Yoshida
Also filed as: YOSHIDA TAKAHO
15 granted patents·1 pending application·116 citations·filing 2004–2015
92Inventor score
Top patents by PatentIndex Score
16 records- 0196US7223983B2Charged particle beam columnHITACHI HIGH TECH CORP·Filed 2005·Granted May 29, 2007·35 cites·11 claims
- 0288US7619218B2Charged particle optical apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 17, 2009·12 cites·10 claims
- 0387US7825377B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 2, 2010·6 cites·12 claims
- 0485US7531799B2Charged particle beam columnHITACHI HIGH TECH CORP·Filed 2007·Granted May 12, 2009·7 cites·20 claims
- 0582US7375323B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2007·Granted May 20, 2008·4 cites·12 claims
- 0682US7199365B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 3, 2007·4 cites·18 claims
- 0781US7211804B2Chromatic aberration corrector for charged particles and charged-particle optical apparatus using the correctorHITACHI HIGH TECH CORP·Filed 2004·Granted May 1, 2007·16 cites·13 claims
- 0878US6982427B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2004·Granted Jan 3, 2006·18 cites·8 claims
- 0975US8035086B2Aberration correction apparatus that corrects spherical aberration of charged particle apparatusHITACHI LTD·Filed 2009·Granted Oct 11, 2011·4 cites·9 claims
- 1074US7732766B2Method for measuring information transfer limit in transmission electron microscope, and transmission electron microscope using the sameHITACHI LTD·Filed 2007·Granted Jun 8, 2010·3 cites·9 claims
- 1171US8866078B2Scanning transmission type electron microscopeAKIMA HISANAO·Filed 2011·Granted Oct 21, 2014·3 cites·10 claims
- 1263US7319225B2Transmission electron microscopeHITACHI LTD·Filed 2006·Granted Jan 15, 2008·1 cites·3 claims
- 1362US9484182B2Charged-particle-beam device and method for correcting aberrationHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 1, 2016·1 cites·12 claims
- 1460US9224574B2Charged particle optical equipment and method for measuring lens aberrationYOSHIDA TAKAHO·Filed 2011·Granted Dec 29, 2015·2 cites·9 claims
- 1550US2009242786A1Aberration corrector for transmission electron microscopeHITACHI LTD·Filed 2009·Application pending·0 cites
- 1634US10217602B2Charged particle beam apparatus and aberration correctorHITACHI HIGH TECH CORP·Filed 2015·Granted Feb 26, 2019·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →